Gallet, Julien
242  Ergebnisse:
Personensuche X
?
2

Increasing FTIR spectromicroscopy speed and resolution thro..:

Gallet, Julien ; Riley, Michael ; Hao, Zhao.
Infrared Physics & Technology.  51 (2008)  5 - p. 420-422 , 2008
 
?
9

Application of electron tomography of dislocations in beam-..:

Mussi, Alexandre ; Gallet, Julien ; Castelnau, Olivier.
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.tecto.2021.228754.  , 2021
 
?
10

Application of electron tomography of dislocations in beam-..:

Mussi, Alexandre ; GALLET, Julien ; Castelnau, Olivier.
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.tecto.2021.228754.  , 2021
 
?
11

Application of electron tomography of dislocations in beam-..:

Mussi, Alexandre ; Gallet, Julien ; Castelnau, Olivier.
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.tecto.2021.228754.  , 2021
 
?
13

Application of electron tomography of dislocations in beam-..:

Mussi, Alexandre ; Gallet, Julien ; Castelnau, Olivier.
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.tecto.2021.228754.  , 2021
 
?
14

Application of electron tomography of dislocations in beam-..:

Mussi, Alexandre ; Gallet, Julien ; Castelnau, Olivier.
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.tecto.2021.228754.  , 2021
 
1-15