Galy, Philippe
304  Ergebnisse:
Personensuche X
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3

Noise modeling using look-up tables and DC measurements for..:

, In: 2023 IFIP/IEEE 31st International Conference on Very Large Scale Integration (VLSI-SoC),
 
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15

Integrated Variability Measurements of 28 nm FDSOI MOSFETs ..:

, In: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS),
 
1-15