Gambino, J.P.
658  Ergebnisse:
Personensuche X
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1

The q2 moments in inclusive semileptonic B decays:

Finauri, G. ; Gambino, P.
Journal of High Energy Physics.  2024 (2024)  2 - p. , 2024
 
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4

Challenges in semileptonic $${\varvec{B}}$$ decays:

Gambino, P. ; Kronfeld, A. S. ; Rotondo, M....
The European Physical Journal C.  80 (2020)  10 - p. , 2020
 
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5

Effect of Residual TiN on Reliability of Au Wire Bonds duri..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
 
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7

Implant Optimization for a 180nm BCD Technology:

, In: 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Greenwood, B. ; Roszol, L. ; Nagy, M.... - p. 1-5 , 2019
 
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9

Micro-photoluminescence imaging of dislocation generation i..:

, In: 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Greenwood, B. ; Gambino, J.P. ; Watanabe, Y.... - p. 5-9 , 2018
 
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10

Polysilicon resistor stability under voltage stress for saf..:

, In: 2018 IEEE International Reliability Physics Symposium (IRPS),
Kendrick, C. ; Cook, M. ; Gambino, J.P.... - p. P-RT.4-1-P-RT.4-5 , 2018
 
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11

Geodetic model of the 2016 Central Italy earthquake sequenc..:

Cheloni, D. ; De Novellis, V. ; Albano, M....
Geophysical Research Letters.  44 (2017)  13 - p. 6778-6787 , 2017
 
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12

Gate oxide yield improvement for 0.18μm power semiconductor..:

, In: 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Greenwood, B. ; Suhwanov, A. ; Daniel, D.... - p. 346-351 , 2017
 
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14

Imaging of strain from deep trenches using X-Ray Diffractio..:

, In: 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Gambino, J. P. ; Watanabe, Y. ; Kanuma, Y.... - p. 321-325 , 2016
 
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