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2020 IEEE International Reliability Physics Symposium (IRPS) ,
5
Effect of Residual TiN on Reliability of Au Wire Bonds duri..:
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2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) ,
7
Implant Optimization for a 180nm BCD Technology:
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2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) ,
9
Micro-photoluminescence imaging of dislocation generation i..:
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2018 IEEE International Reliability Physics Symposium (IRPS) ,
10
Polysilicon resistor stability under voltage stress for saf..:
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2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) ,
12
Gate oxide yield improvement for 0.18μm power semiconductor..:
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2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
14