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Gaoxian, Li
35  Ergebnisse:
Personensuche X
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1

Nitrogen-terminated diamond (111) surface for nitrogen-vaca..:

Gaoxian, Li ; Wei, Cheng ; Nan, Gao..
Diamond and Related Materials.  142 (2024)  - p. 110813 , 2024
Link: https://doi.org/10.1016/..
 
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2

n-type doping of diamond surface by potassium:

Liu, Yaning ; Li, Gaoxian ; Gao, Nan.
Diamond and Related Materials.  140 (2023)  - p. 110465 , 2023
Link: https://doi.org/10.1016/..
 
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3

Diamond/c-BN van der Waals heterostructure with modulated e..:

Jia, Su-Na ; Li, Gao-Xian ; Gao, Nan..
Chinese Physics B.  32 (2023)  7 - p. 077301 , 2023
Link: https://doi.org/10.1088/..
 
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4

Thermal Management Method and Optimization:

, In: CPSS Power Electronics Series; Thermal Reliability of Power Semiconductor Device in the Renewable Energy System,
Du, Xiong ; Zhang, Jun ; Li, Gaoxian... - p. 137-160 , 2022
Link: https://doi.org/10.1007/..
 
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5

Introduction:

, In: CPSS Power Electronics Series; Thermal Reliability of Power Semiconductor Device in the Renewable Energy System,
Du, Xiong ; Zhang, Jun ; Li, Gaoxian... - p. 1-16 , 2022
Link: https://doi.org/10.1007/..
 
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6

Thermal Fatigue Failure Mechanism of IGBT Module:

, In: CPSS Power Electronics Series; Thermal Reliability of Power Semiconductor Device in the Renewable Energy System,
Du, Xiong ; Zhang, Jun ; Li, Gaoxian... - p. 17-33 , 2022
Link: https://doi.org/10.1007/..
 
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7

Junction Temperature Extraction of the Power Semiconductor ..:

, In: CPSS Power Electronics Series; Thermal Reliability of Power Semiconductor Device in the Renewable Energy System,
Du, Xiong ; Zhang, Jun ; Li, Gaoxian... - p. 73-106 , 2022
Link: https://doi.org/10.1007/..
 
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8

Thermal Model and Thermal Parameter Monitoring:

, In: CPSS Power Electronics Series; Thermal Reliability of Power Semiconductor Device in the Renewable Energy System,
Du, Xiong ; Zhang, Jun ; Li, Gaoxian... - p. 35-71 , 2022
Link: https://doi.org/10.1007/..
 
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9

Prospect:

, In: CPSS Power Electronics Series; Thermal Reliability of Power Semiconductor Device in the Renewable Energy System,
Du, Xiong ; Zhang, Jun ; Li, Gaoxian... - p. 161-172 , 2022
Link: https://doi.org/10.1007/..
 
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10

Multi-time Scale Lifetime Evaluation of the Device in the R..:

, In: CPSS Power Electronics Series; Thermal Reliability of Power Semiconductor Device in the Renewable Energy System,
Du, Xiong ; Zhang, Jun ; Li, Gaoxian... - p. 107-136 , 2022
Link: https://doi.org/10.1007/..
 
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11

Thermal Reliability of Power Semiconductor Device in the Re.. 

CPSS Power Electronics Series
Du, Xiong ; Zhang, Jun ; Li, Gaoxian... - 1st ed. 2022 . , 2022
Link: https://doi.org/10.1007/..
 
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12

Numerical junction temperature calculation method for relia..:

Du, Xiao ; Du, Xiong ; Zhang, Jun.
Journal of Power Electronics.  21 (2020)  1 - p. 184-194 , 2020
Link: https://doi.org/10.1007/..
 
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13

Lifetime estimation for IGBT modules in wind turbine power ..:

Du, Xiong ; Zhang, Jun ; Li, Gaoxian...
Microelectronics Reliability.  65 (2016)  - p. 69-78 , 2016
Link: https://doi.org/10.1016/..
 
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14

Edge intelligence empowered delivery route planning for han..:

Peng, Gaoxian ; Wen, Yiping ; Dou, Wanchun...
Journal of Cloud Computing.  13 (2024)  1 - p. , 2024
Link: https://doi.org/10.1186/..
 
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15

Application of ATR-FTIR spectroscopy and chemometrics for t..:

Wang, Hanting ; Ding, Xuan ; He, Xin...
Microchemical Journal.  197 (2024)  - p. 109933 , 2024
Link: https://doi.org/10.1016/..
 
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