Ge, Mengran
64  Ergebnisse:
Personensuche X
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1

Modeling of electroplated diamond wire and its application ..:

Ge, Mengran ; Zhang, Chenzheng ; Wang, Peizhi..
Journal of Manufacturing Processes.  87 (2023)  - p. 141-149 , 2023
 
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2

Effect of a liquid bridge on the dynamic behavior of diamon..:

Zheng, Jintao ; Ge, Mengran ; Ge, Peiqi..
Journal of Manufacturing Processes.  94 (2023)  - p. 578-591 , 2023
 
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3

Effect of liquid bridge on the thickness deviation between ..:

Zheng, Jintao ; Ge, Mengran ; Ge, Peiqi...
Journal of Manufacturing Processes.  108 (2023)  - p. 268-279 , 2023
 
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7

Crack damage control for diamond wire sawing of silicon: Th..:

Ge, Mengran ; Chen, Zibin ; Wang, Peizhi.
Materials Science in Semiconductor Processing.  148 (2022)  - p. 106838 , 2022
 
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8

Fabrication of thin resin-bonded diamond wire and its appli..:

Ge, Mengran ; Wang, Peizhi ; Bi, Wenbo.
Materials Science in Semiconductor Processing.  126 (2021)  - p. 105665 , 2021
 
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10

Investigation on residual scratch depth and material remova..:

Ge, Mengran ; Zhu, Hongtao ; Ge, Peiqi.
Materials Science in Semiconductor Processing.  100 (2019)  - p. 98-105 , 2019
 
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11

Fabrication and performance evaluation for resin-bonded dia..:

Ge, Mengran ; Bi, Wenbo ; Ge, Peiqi.
The International Journal of Advanced Manufacturing Technology.  98 (2018)  9-12 - p. 3269-3277 , 2018
 
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12

The interaction of periodically distributed parallel cracks..:

Wang, Peizhi ; Ge, Peiqi ; Bi, Wenbo..
Engineering Fracture Mechanics.  199 (2018)  - p. 131-142 , 2018
 
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13

Investigation on critical crack-free cutting depth for sing..:

Ge, Mengran ; Zhu, Hongtao ; Huang, Chuanzhen..
Materials Science in Semiconductor Processing.  74 (2018)  - p. 261-266 , 2018
 
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14

Effect of wire speed on subsurface cracks in wire sawing pr..:

Wang, Peizhi ; Ge, Peiqi ; Bi, Wenbo..
Engineering Fracture Mechanics.  184 (2017)  - p. 273-285 , 2017
 
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15

A scratching force model of diamond abrasive particles in w..:

Wang, Peizhi ; Ge, Peiqi ; Li, Zongqiang..
Materials Science in Semiconductor Processing.  68 (2017)  - p. 21-29 , 2017
 
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