E-LIB Suche - Ergebnisse für: Geiser, Brian

1

Mesoscopic modeling of field evaporation on atom probe tomo..:

Hatzoglou, Constantinos ; Klaes, Benjamin ; Delaroche, Fabien...
Journal of Physics D: Applied Physics. 56 (2023) 37 - p. 375301 , 2023

Link: https://doi.org/10.1088/..

2

Automated calibration of model-driven reconstructions in at..:

Fletcher, Charles ; Moody, Michael P ; Fleischmann, Claudia...
Journal of Physics D: Applied Physics. 55 (2022) 37 - p. 375301 , 2022

Link: https://doi.org/10.1088/..

3

Directions in Atom Probe Tomography:

Larson, David ; Lenz, Dan ; Martin, Isabelle...
Microscopy and Microanalysis. 27 (2021) S1 - p. 2464-2466 , 2021

Link: https://doi.org/10.1017/..

4

Challenges in Atom Probe Tomography Instrumentation and Rec..:

Reinhard, David ; Larson, David ; Geiser, Brian...
Microscopy and Microanalysis. 27 (2021) S1 - p. 2038-2040 , 2021

Link: https://doi.org/10.1017/..

5

Electrostatic Reconstruction Technology in Atom Probe Tomog..:

Geiser, Brian ; Martin, Isabelle ; Reinhard, David...
Microscopy and Microanalysis. 27 (2021) S1 - p. 2482-2483 , 2021

Link: https://doi.org/10.1017/..

6

Enhanced Atom Probe Imaging using Generalised Field Evapora..:

Fletcher, Charles ; Moody, Michael ; Scheerder, Jeroen...
Microscopy and Microanalysis. 27 (2021) S1 - p. 404-406 , 2021

Link: https://doi.org/10.1017/..

7

A System for Electrostatic Reconstructions:

Geiser, Brian ; Bunton, Joe ; Martin, Isabelle...
Microscopy and Microanalysis. 26 (2020) S2 - p. 2622-2623 , 2020

Link: https://doi.org/10.1017/..

8

Study of Correlative Evaporation and Ion Dissociation in At..:

Chen, Yimeng ; Geiser, Brian ; Oltman, Ed...
Microscopy and Microanalysis. 26 (2020) S2 - p. 2882-2882 , 2020

Link: https://doi.org/10.1017/..

9

Increased LEAP Utilization Through Automation of Multi-spec..:

Reinhard, David ; Payne, Tim ; Strennen, Eric...
Microscopy and Microanalysis. 26 (2020) S2 - p. 2616-2616 , 2020

Link: https://doi.org/10.1017/..

10

Introducing a Dynamic Reconstruction Methodology for Multil..:

Hatzoglou, Constantinos ; Da Costa, Gérald ; Wells, Peter...
Microscopy and Microanalysis. 29 (2023) 3 - p. 1124-1136 , 2023

Link: https://doi.org/10.1093/..

11

New Product Announcement – Invizo 6000, New Applications, N..:

Reinhard, David A ; Lenz, Daniel ; Martin, Isabelle...
Microscopy and Microanalysis. 28 (2022) S1 - p. 3188-3189 , 2022

Link: https://doi.org/10.1017/..

12

A Reconstruction Wizard for Electrostatic Reconstruction:

Geiser, Brian P ; Reinhard, David ; Bunton, Joseph...
Microscopy and Microanalysis. 28 (2022) S1 - p. 704-705 , 2022

Link: https://doi.org/10.1017/..

13

Benefits of a Full Field of View in Atom Probe Tomography:

Reinhard, David A ; Rice, Katherine P ; Ulfig, Robert M...
Microscopy and Microanalysis. 28 (2022) S1 - p. 706-708 , 2022

Link: https://doi.org/10.1017/..

14

AP Suite Extension Infrastructure:

Payne, James E ; Reinhard, David A ; Payne, Tim R..
Microscopy and Microanalysis. 28 (2022) S1 - p. 730-731 , 2022

Link: https://doi.org/10.1017/..

15

The Prospect of Spatially Accurate Reconstructed Atom Probe..:

Op de Beeck, Jonathan ; Scheerder, Jeroen E ; Geiser, Brian P...
Microscopy and Microanalysis. 28 (2022) 4 - p. 1141-1149 , 2022

Link: https://doi.org/10.1017/..