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Geiser, Brian P
223  Ergebnisse:
Personensuche X
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1

Introducing a Dynamic Reconstruction Methodology for Multil..:

Hatzoglou, Constantinos ; Da Costa, Gérald ; Wells, Peter...
Microscopy and Microanalysis.  29 (2023)  3 - p. 1124-1136 , 2023
Link: https://doi.org/10.1093/..
 
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2

A Reconstruction Wizard for Electrostatic Reconstruction:

Geiser, Brian P ; Reinhard, David ; Bunton, Joseph...
Microscopy and Microanalysis.  28 (2022)  S1 - p. 704-705 , 2022
Link: https://doi.org/10.1017/..
 
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3

New Product Announcement – LEAP 6000XR, New Applications, N..:

Ulfig, Robert ; Lenz, Daniel ; Groth, Gard...
Microscopy and Microanalysis.  28 (2022)  S1 - p. 3190-3191 , 2022
Link: https://doi.org/10.1017/..
 
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4

The Prospect of Spatially Accurate Reconstructed Atom Probe..:

Op de Beeck, Jonathan ; Scheerder, Jeroen E ; Geiser, Brian P...
Microscopy and Microanalysis.  28 (2022)  4 - p. 1141-1149 , 2022
Link: https://doi.org/10.1017/..
 
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5

New Product Announcement – Invizo 6000, New Applications, N..:

Reinhard, David A ; Lenz, Daniel ; Martin, Isabelle...
Microscopy and Microanalysis.  28 (2022)  S1 - p. 3188-3189 , 2022
Link: https://doi.org/10.1017/..
 
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6

Benefits of a Full Field of View in Atom Probe Tomography:

Reinhard, David A ; Rice, Katherine P ; Ulfig, Robert M...
Microscopy and Microanalysis.  28 (2022)  S1 - p. 706-708 , 2022
Link: https://doi.org/10.1017/..
 
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7

AP Suite Extension Infrastructure:

Payne, James E ; Reinhard, David A ; Payne, Tim R..
Microscopy and Microanalysis.  28 (2022)  S1 - p. 730-731 , 2022
Link: https://doi.org/10.1017/..
 
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8

Recent Reconstruction Developments in IVAS:

Geiser, Brian P. ; Vurpillot, Francois ; Chen, Yimeng...
Microscopy and Microanalysis.  23 (2017)  S1 - p. 638-639 , 2017
Link: https://doi.org/10.1017/..
 
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9

Automated Crystallographic Identification of Atom Probe's I..:

Chen, Yimeng ; Rice, Katherine P. ; Prosa, Ty J....
Microscopy and Microanalysis.  23 (2017)  S1 - p. 662-663 , 2017
Link: https://doi.org/10.1017/..
 
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10

Reconstructing atom probe data: A review:

Vurpillot, Francois ; Gault, Baptiste ; Geiser, Brian P..
Ultramicroscopy.  132 (2013)  - p. 19-30 , 2013
Link: https://doi.org/10.1016/..
 
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11

Electrostatic simulations of a local electrode atom probe: ..:

Loi, Shyeh Tjing ; Gault, Baptiste ; Ringer, Simon P...
Ultramicroscopy.  132 (2013)  - p. 107-113 , 2013
Link: https://doi.org/10.1016/..
 
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12

On the Use of Simulated Field-Evaporated Specimen Apex Shap..:

Larson, David J. ; Geiser, Brian P. ; Prosa, Ty J..
Microscopy and Microanalysis.  18 (2012)  5 - p. 953-963 , 2012
Link: https://doi.org/10.1017/..
 
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13

Spatial Distribution Maps for Atom Probe Tomography:

Geiser, Brian P. ; Kelly, Thomas F. ; Larson, David J...
Microscopy and Microanalysis.  13 (2007)  6 - p. 437-447 , 2007
Link: https://doi.org/10.1017/..
 
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14

Atom Probe Tomography Spatial Reconstruction: Status and Di..:

Larson, David J ; Gault, Baptiste ; Geiser, Brian P..
http://arxiv.org/abs/1510.02843.  , 2015
Link: http://arxiv.org/abs/151..
 
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15

Automated calibration of model-driven reconstructions in at..:

Fletcher, Charles ; Moody, Michael P ; Fleischmann, Claudia...
Journal of Physics D: Applied Physics.  55 (2022)  37 - p. 375301 , 2022
Link: https://doi.org/10.1088/..
 
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