E-LIB Suche - Ergebnisse für: Gerardin, S.

1

Radiation-Induced Effects in SiC Vertical Power MOSFETs Irr..:

Bonaldo, S. ; Martinella, C. ; Race, S....
IEEE Transactions on Nuclear Science. 71 (2024) 4 - p. 418-426 , 2024

Link: https://doi.org/10.1109/..

2

Depth Dependence of Neutron-Induced Errors in 3-D NAND Floa..:

Gerardin, S. ; Bagatin, M. ; Paccagnella, A....
IEEE Transactions on Nuclear Science. 71 (2024) 4 - p. 508-514 , 2024

Link: https://doi.org/10.1109/..

3

Secondary Particles Generated by Protons in 3-D nand Flash ..:

Bagatin, M. ; Gerardin, S. ; Paccagnella, A....
IEEE Transactions on Nuclear Science. 69 (2022) 7 - p. 1461-1466 , 2022

Link: https://doi.org/10.1109/..

4

X-ray Radiation Effects Assessment on NVMs manufactured in ..:

, In: 2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS),

Benfante, A. ; Crippa, D. ; Jain, A.... - p. 1-5 , 2022

Link: https://doi.org/10.1109/..

5

Energy Deposition by Ultrahigh Energy Ions in Large and Sma..:

Bagatin, M. ; Gerardin, S. ; Paccagnella, A....
IEEE Transactions on Nuclear Science. 69 (2022) 3 - p. 241-247 , 2022

Link: https://doi.org/10.1109/..

6

Development of a Fully-distributed Stretcher-based Single E..:

, In: 2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS),

Benfante, A. ; Crippa, D. ; Jain, A.... - p. 1-4 , 2022

Link: https://doi.org/10.1109/..

7

Alpha, Heavy Ion and Neutron Test Results On 90nm ST BCD-CM..:

, In: 2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS),

Jain, A. ; Veggetti, A. ; Crippa, D.... - p. 1-5 , 2020

Link: https://doi.org/10.1109/..

8

Single Phase Clock Based Radiation Tolerant D Flip-flop Cir..:

, In: 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS),

Jain, A. ; Veggetti, A. ; Crippa, D.... - p. 1-6 , 2020

Link: https://doi.org/10.1109/..

9

1GigaRad TID impact on 28 nm HEP analog circuits:

Resta, F. ; Gerardin, S. ; Mattiazzo, S....
Integration. 63 (2018) - p. 306-314 , 2018

Link: https://doi.org/10.1016/..

10

Thermal Modeling of the Injection of Standard and Thermally..:

Castro-Cedeno, E.-I. ; Jardy, A. ; Carré, A...
Metallurgical and Materials Transactions B. 48 (2017) 6 - p. 3316-3328 , 2017

Link: https://doi.org/10.1007/..

11

Total Ionizing Dose effects on a 28 nm Hi-K metal-gate CMOS..:

Mattiazzo, S. ; Bagatin, M. ; Bisello, D....
Journal of Instrumentation. 12 (2017) 2 - p. C02003-C02003 , 2017

Link: https://doi.org/10.1088/..

12

Impact of proton fluence on DC and trapping characteristics..:

Rossetto, I. ; Rampazzo, F. ; Gerardin, S....
Solid-State Electronics. 113 (2015) - p. 15-21 , 2015

Link: https://doi.org/10.1016/..

13

Recoverable degradation of blue InGaN-based light emitting ..:

De Santi, C. ; Meneghini, M. ; Trivellin, N....
Applied Physics Letters. 105 (2014) 21 - p. , 2014

Link: https://doi.org/10.1063/..

14

Developments on DC/DC converters for the LHC experiment upg..:

Abbate, C ; Alderighi, M ; Baccaro, S...
Journal of Instrumentation. 9 (2014) 2 - p. C02017-C02017 , 2014

Link: https://doi.org/10.1088/..

15

Proton induced trapping effect on space compatible GaN HEMT:

Stocco, A. ; Gerardin, S. ; Bisi, D....
Microelectronics Reliability. 54 (2014) 9-10 - p. 2213-2216 , 2014

Link: https://doi.org/10.1016/..