Ghots, S S
12  Ergebnisse:
Personensuche X
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1

Degradation processes in tungsten filaments at high tempera..:

Zakharov, Y A ; Ghots, S S ; Sharipov, T I.
Journal of Physics: Conference Series.  2119 (2021)  1 - p. 012139 , 2021
 
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2

Study of the Spectrumof Low-Frequency Current Fluctuations ..:

Zakharov, Yu.A. ; Ghots, S. S. ; Bakhtizin, R. Z.
Radiophysics and Quantum Electronics.  63 (2020)  3 - p. 227-240 , 2020
 
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3

Primary information sensors for AFM based on quasiparticle ..:

Petrov, A. B. ; Bakhtizin, R. Z. ; Ghots, S. S.
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques.  11 (2017)  2 - p. 401-403 , 2017
 
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4

Analysis of the problems of statistical estimations in stoc..:

Ghots, S. S. ; Bakhtizin, R. Z.
Radiophysics and Quantum Electronics.  52 (2009)  3 - p. 227-234 , 2009
 
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5

Model of m-level low-frequency current fluctuations in meta..:

Ghots, S.S. ; Bakhtizin, R.Z.
Applied Surface Science.  215 (2003)  1-4 - p. 105-112 , 2003
 
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6

Statistical model of semiconductor field emitter with atomi..:

Bakhtizin, R Z ; Ghots, S S ; Glazer, P V
Journal of Micromechanics and Microengineering.  3 (1993)  2 - p. 45-48 , 1993
 
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7

Statistical model of semiconductor field emitter:

Bakhtizin, R.Z. ; Ghots, S.S.
Surface Science.  266 (1992)  1-3 - p. 121-125 , 1992
 
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10

FIELD EMISSION CURRENT FLUCTUATIONS FROM SEMICONDUCTORS : S..:

Bakhtizin, R ; Ghots, S
info:eu-repo/semantics/altIdentifier/doi/10.1051/jphyscol:1989818.  , 1989
 
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11

PECULIARITIES OF FIELD ELECTRON EMISSION FROM HIGH - TEMPER..:

Bakhtizin, R ; Ghots, S ; Mesyats, V..
info:eu-repo/semantics/altIdentifier/doi/10.1051/jphyscol:1988684.  , 1988
 
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12

RECENT RESULTS OF MODELING OF STATISTIC CHARACTERISTICS OF ..:

Bakhtizin, R ; Ghots, S ; Chernin-Yakhnuk, I
info:eu-repo/semantics/altIdentifier/doi/10.1051/jphyscol:1987633.  , 1987
 
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