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Gizopoulos, D
165  Ergebnisse:
Personensuche X
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1

SyRA: Early System Reliability Analysis for Cross-Layer Sof..:

Vallero, A. ; Savino, A. ; Chatzidimitriou, A....
IEEE Transactions on Computers.  68 (2019)  5 - p. 765-783 , 2019
Link: https://doi.org/10.1109/..
 
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2

Cross-layer reliability evaluation, moving from the hardwar..:

Vallero, A. ; Tselonis, S. ; Foutris, N....
Microprocessors and Microsystems.  39 (2015)  8 - p. 1204-1214 , 2015
Link: https://doi.org/10.1016/..
 
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3

Session details: On-line test and fault tolerance:

, In: Proceedings of the Conference on Design, Automation and Test in Europe,
Gizopoulos, D. ; Nicolaidis, M. , 2012
Link: https://dl.acm.org/doi/1..
 
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4

Low Energy Online Self-Test of Embedded Processors in Depen..:

Merentitis, A. ; Kranitis, N. ; Paschalis, A..
IEEE Transactions on Dependable and Secure Computing.  9 (2012)  1 - p. 86-100 , 2012
Link: https://doi.org/10.1109/..
 
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5

Online Periodic Self-Test Scheduling for Real-Time Processo..:

Gizopoulos, D.
IEEE Transactions on Dependable and Secure Computing.  6 (2009)  2 - p. 152-158 , 2009
Link: https://doi.org/10.1109/..
 
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6

Instruction-Based Online Periodic Self-Testing of Microproc..:

Xenoulis, G. ; Gizopoulos, D. ; Psarakis, M..
IEEE Transactions on Dependable and Secure Computing.  6 (2009)  2 - p. 124-134 , 2009
Link: https://doi.org/10.1109/..
 
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7

Functional self-testing for bus-based symmetric multiproces..:

, In: Proceedings of the conference on Design, automation and test in Europe,
Apostolakis, A. ; Gizopoulos, D. ; Psarakis, M.. - p. 1304-1309 , 2008
Link: https://dl.acm.org/doi/1..
 
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8

Systematic Software-Based Self-Test for Pipelined Processor:

Gizopoulos, D. ; Psarakis, M. ; Hatzimihail, M....
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  16 (2008)  11 - p. 1441-1453 , 2008
Link: https://doi.org/10.1109/..
 
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9

Functional Processor-Based Testing of Communication Periphe..:

Apostolakis, A. ; Psarakis, M. ; Gizopoulos, D..
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  15 (2007)  8 - p. 971-975 , 2007
Link: https://doi.org/10.1109/..
 
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10

Session details: Nano and FIFO:

, In: Proceedings of the conference on Design, automation and test in Europe,
Larsson, E. ; Gizopoulos, D. , 2007
Link: https://dl.acm.org/doi/1..
 
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11

Systematic software-based self-test for pipelined processor:

, In: 2006 43rd ACM/IEEE Design Automation Conference,
Psarakis, M. ; Gizopoulos, D. ; Hatzimihail, M.... - p. 393-398 , 2006
Link: https://doi.org/10.1145/..
 
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12

Accumulator-based test generation for robust sequential fau..:

Voyiatzis, I. ; Gizopoulos, D. ; Paschalis, A.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  13 (2005)  9 - p. 1079-1086 , 2005
Link: https://doi.org/10.1109/..
 
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13

Guest Editors' Introduction: Design for Yield and Reliabili..:

Zorian, Y. ; Gizopoulos, D. ; Vandenberg, C..
IEEE Design and Test of Computers.  21 (2004)  3 - p. 177-182 , 2004
Link: https://doi.org/10.1109/..
 
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14

DF for low cost testers [Tutorial]:

, In: Proceedings Design, Automation and Test in Europe Conference and Exhibition,
Gizopoulos, D. ; Eide, G. ; Crouch, A.. - p. xxx , 2004
Link: https://doi.org/10.1109/..
 
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15

Low-Cost Software-Based Self-Testing of RISC Processor Core:

, In: Proceedings of the conference on Design, Automation and Test in Europe - Volume 1,
Kranitis, N. ; Xenoulis, G. ; Gizopoulos, D... - p. 10714 ff. , 2003
Link: https://dl.acm.org/doi/1..
 
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