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Goel, Nilesh
179  Ergebnisse:
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1

Aging Analysis of CMOS Based Synaptic Circuits:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Negi, Krishna ; Babu, Jani ; Picardo, Siona Menezes.. - p. 1-3 , 2024
Link: https://doi.org/10.1109/..
 
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2

Unconventional Breathing Currents Far beyond the Quantum Tu..:

Satheesh, Aravind ; Yang, Chia-Ming ; Gaidhane, Vilas...
Nano Letters.  24 (2024)  10 - p. 3157-3164 , 2024
Link: https://doi.org/10.1021/..
 
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3

Reliability-aware design of Integrate-and-Fire silicon neur..:

Shaik, Jani Babu ; Picardo, Siona Menezes ; Singhal, Sonal.
Integration.  94 (2024)  - p. 102101 , 2024
Link: https://doi.org/10.1016/..
 
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4

Enabling efficient rate and temporal coding using reliabili..:

Picardo, Siona Menezes ; Shaik, Jani Babu ; Singhal, Sonal.
International Journal of Circuit Theory and Applications.  50 (2022)  12 - p. 4234-4250 , 2022
Link: https://doi.org/10.1002/..
 
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5

Impact of Reliability Issues and Process Variability in Neu..:

, In: 2022 IEEE Region 10 Symposium (TENSYMP),
Shaik, Jani Babu ; Picardo, Siona Menezes ; Singhal, Sonal. - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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6

Impact of various NBTI distributions on SRAM performance fo..:

Shaik, Jani Babu ; Singhal, Sonal ; Picardo, Siona Menezes.
Integration.  83 (2022)  - p. 60-66 , 2022
Link: https://doi.org/10.1016/..
 
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7

Device Reliability Affecting Coding Schemes in Neuromorphic..:

, In: 2022 IEEE Region 10 Symposium (TENSYMP),
Picardo, Siona Menezes ; Shaik, Jani Babu ; Singhal, Sonal. - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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8

Physical Mechanism of NBTI Parametric Drift:

, In: Recent Advances in PMOS Negative Bias Temperature Instability,
Mahapatra, Souvik ; Parihar, Narendra ; Mukhopadhyay, Subhadeep. - p. 37-58 , 2021
Link: https://doi.org/10.1007/..
 
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9

Native multiqubit Toffoli gates on ion trap quantum compute..:

Goel, Nilesh ; Freericks, J K
Quantum Science and Technology.  6 (2021)  4 - p. 044010 , 2021
Link: https://doi.org/10.1088/..
 
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10

BTI Analysis Tool (BAT) Model Framework—Generation of Inter..:

, In: Recent Advances in PMOS Negative Bias Temperature Instability,
Mahapatra, Souvik ; Parihar, Narendra ; Mukhopadhyay, Subhadeep. - p. 59-80 , 2021
Link: https://doi.org/10.1007/..
 
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11

BTI Analysis Tool (BAT) Model Framework—Interface Trap Occu..:

, In: Recent Advances in PMOS Negative Bias Temperature Instability,
Mahapatra, Souvik ; Parihar, Narendra ; Choudhury, Nilotpal. - p. 81-102 , 2021
Link: https://doi.org/10.1007/..
 
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12

Characterization of NBTI Parametric Drift:

, In: Recent Advances in PMOS Negative Bias Temperature Instability,
Mahapatra, Souvik ; Goel, Nilesh ; Parihar, Narendra - p. 1-19 , 2021
Link: https://doi.org/10.1007/..
 
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13

Reliability‐aware design of temporal neuromorphic encoder f..:

Shaik, Jani Babu ; VS, Aadhitiya ; Singhal, Sonal.
International Journal of Circuit Theory and Applications.  50 (2021)  4 - p. 1130-1142 , 2021
Link: https://doi.org/10.1002/..
 
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14

BAT Framework Modeling of Gate First HKMG Si Channel MOSFET:

, In: Recent Advances in PMOS Negative Bias Temperature Instability,
Mahapatra, Souvik ; Parihar, Narendra ; Goel, Nilesh.. - p. 127-149 , 2021
Link: https://doi.org/10.1007/..
 
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15

BAT Framework Modeling of AC NBTI: Stress Mode, Duty Cycle ..:

, In: Recent Advances in PMOS Negative Bias Temperature Instability,
Mahapatra, Souvik ; Parihar, Narendra ; Goel, Nilesh... - p. 287-304 , 2021
Link: https://doi.org/10.1007/..
 
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