Gomiero, E.
46  Ergebnisse:
Personensuche X
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1

BEOL Process Effects on ePCM Reliability:

Redaelli, A. ; Gandolfo, A. ; Samanni, G....
IEEE Journal of the Electron Devices Society.  10 (2022)  - p. 563-568 , 2022
 
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2

Heater system optimization for robust ePCM reliability and ..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Ranica, R. ; Berthelon, R. ; Gandolfo, A.... - p. 28.1.1-28.1.4 , 2021
 
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3

Crystallization Speed in Ge-Rich PCM Cells as a Function of..:

Gomiero, E. ; Ristoiu, D. ; Reynard, J. P....
IEEE Journal of the Electron Devices Society.  7 (2019)  - p. 517-521 , 2019
 
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4

Cell array structure test in EEPROM reliability assessment ..:

Pio, F ; Gomiero, E
Microelectronics Reliability.  40 (2000)  4-5 - p. 719-722 , 2000
 
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5

MOSFET parameter degradation after Fowler–Nordheim injectio..:

Candelori, A ; Gomiero, E ; Ghidini, G.
Microelectronics Reliability.  38 (1998)  2 - p. 189-193 , 1998
 
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6

BEOL Process Effects on ePCM Reliability:

A. Redaelli ; A. Gandolfo ; G. Samanni...
https://ieeexplore.ieee.org/document/9743565/.  , 2022
 
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10

Short forms of Prudhoe Cognitive Function Test in adults an..:

De Vreese, L. P. ; Gomiero, T. ; De Bastiani, E....
Journal of Intellectual Disability Research.  65 (2020)  2 - p. 162-172 , 2020
 
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11

Gill damage and delayed mortality of Northern shrimp (Panda..:

Bechmann, Renée Katrin ; Arnberg, Maj ; Gomiero, Alessio...
Ecotoxicology and Environmental Safety.  180 (2019)  - p. 473-482 , 2019
 
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12

Load validation of aero-elastic simulations with measuremen..:

Paulsen, U S ; Gomiero, M ; Larsen, T J.
Journal of Physics: Conference Series.  1037 (2018)  - p. 062023 , 2018
 
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13

Bone turnover markers, BMD and TBS after short-term, high-d..:

Censi, S. ; Manso, J. ; Pandolfo, G....
Journal of Endocrinological Investigation.  42 (2018)  7 - p. 859-865 , 2018
 
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