Gong, N.
6392  Ergebnisse:
Personensuche X
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1

Local changes in function and microstructural features of s..:

Gong, J.N.
International Journal of Psychophysiology.  188 (2023)  - p. 71 , 2023
 
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4

A Comprehensive Study on the Pillar Size of OTS-PCM Memory ..:

, In: 2023 IEEE International Memory Workshop (IMW),
Chien, W.C. ; Lai, E.K. ; Buzi, L.... - p. 1-4 , 2023
 
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5

Device Study on OTS-PCM for Persistent Memory Application :..:

, In: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Chien, W. C. ; Gignac, L. M. ; Chou, Y. C.... - p. 327-329 , 2022
 
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6

Deep learning acceleration in 14nm CMOS compatible ReRAM ar..:

, In: 2022 International Electron Devices Meeting (IEDM),
Gong, N. ; Rasch, M.J. ; Seo, S.-C.... - p. 33.7.1-33.7.4 , 2022
 
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7

POS-698 Current Apparent Treatment-Resistant Hypertension i..:

LI, D. ; Huo, Z. ; Liu, D....
Kidney International Reports.  7 (2022)  2 - p. S300 , 2022
 
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9

New Phase-Change Materials by Atomic-Level Engineering the ..:

, In: 2022 International Electron Devices Meeting (IEDM),
Cheng, H. Y. ; Grun, A. ; Chien, W C.... - p. 18.5.1-18.5.4 , 2022
 
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10

Mushroom-Type phase change memory with projection liner: An..:

, In: 2021 IEEE International Reliability Physics Symposium (IRPS),
Bruce, R.L. ; Sarwat, S. Ghazi ; Boybat, I.... - p. 1-6 , 2021
 
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11

Optimizing AsSeGe Chalcogenides by Dopants for Extremely Lo..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Cheng, H. Y. ; Chien, W C. ; Kuo, I. T.... - p. 28.6.1-28.6.4 , 2021
 
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12

A no-verification Multi-Level-Cell (MLC) operation in Cross..:

, In: 2020 IEEE Symposium on VLSI Technology,
Gong, N. ; Chien, W. ; Chou, Y.... - p. 1-2 , 2020
 
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13

The significant impact of mechanically-induced phase transf..:

Challa, V.S.A. ; Nune, K.C. ; Gong, N..
Journal of the Mechanical Behavior of Biomedical Materials.  108 (2020)  - p. 103815 , 2020
 
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14

On the mechanical behavior of austenitic stainless steel wi..:

Gong, N. ; Hu, C. ; Hu, B...
Journal of the Mechanical Behavior of Biomedical Materials.  101 (2020)  - p. 103433 , 2020
 
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