E-LIB Suche - Ergebnisse für: Gornik, A. E.

1

If Opportunity Knocks: Understanding Contextual Factors' In..:

Gornik, A. E. ; Jacobson, L. A. ; Kalb, L. G..
Research on Child and Adolescent Psychopathology. 52 (2023) 4 - p. 521-533 , 2023

Link: https://doi.org/10.1007/..

2

On neurology and policy:

Neu, E. ; Michailov, M. ; Birkenbihl, P....
Journal of the Neurological Sciences. 405 (2019) - p. 148-149 , 2019

Link: https://doi.org/10.1016/..

3

On education and research in context of integrative toxicol..:

Neu, E. ; Michailov, M.C. ; Senn, T....
Toxicology Letters. 258 (2016) - p. S304 , 2016

Link: https://doi.org/10.1016/..

4

An integrative toxicology in education and research: Summar..:

Neu, E. ; Michailov, M.C. ; Senn, T....
Toxicology Letters. 259 (2016) - p. S109 , 2016

Link: https://doi.org/10.1016/..

5

Large Rashba effect in GaAsSb/InGaAs RTDs at high temperatu..:

de Sousa, J. Silvano ; Detz, H. ; Klang, P....
Journal of the Korean Physical Society. 60 (2012) 10 - p. 1762-1766 , 2012

Link: https://doi.org/10.3938/..

6

Application of transient interferometric mapping method for..:

Pogany, D. ; Bychikhin, S. ; Heer, M...
Microelectronics Reliability. 51 (2011) 9-11 - p. 1592-1596 , 2011

Link: https://doi.org/10.1016/..

7

Enhanced Rashba effect in transverse magnetic fields observ..:

Silvano de Sousa, J. ; Detz, H. ; Klang, P....
Applied Physics Letters. 99 (2011) 15 - p. , 2011

Link: https://doi.org/10.1063/..

8

Nonparabolicity effects in InGaAs/GaAsSb double barrier res..:

Silvano de Sousa, J. ; Detz, H. ; Klang, P....
Journal of Applied Physics. 108 (2010) 7 - p. , 2010

Link: https://doi.org/10.1063/..

9

Single pulse energy capability and failure modes of n- and ..:

Podgaynaya, A. ; Rudolf, R. ; Elattari, B....
Microelectronics Reliability. 50 (2010) 9-11 - p. 1347-1351 , 2010

Link: https://doi.org/10.1016/..

10

Interaction of traveling current filaments and its relation..:

Mamanee, W. ; Johnsson, D. ; Rodin, P....
Journal of Applied Physics. 105 (2009) 8 - p. , 2009

Link: https://doi.org/10.1063/..

11

Thermal imaging of smart power DMOS transistors in the ther..:

Haberfehlner, G. ; Bychikhin, S. ; Dubec, V....
Microelectronics Reliability. 49 (2009) 9-11 - p. 1346-1351 , 2009

Link: https://doi.org/10.1016/..

12

Analysis of degradation mechanisms in lattice-matched InAlN..:

Kuzmik, J. ; Pozzovivo, G. ; Ostermaier, C....
Journal of Applied Physics. 106 (2009) 12 - p. , 2009

Link: https://doi.org/10.1063/..

13

Controlled generation of resonant electron-electron scatter..:

Coquelin, M. ; Strasser, G. ; Gornik, E...
Applied Physics Letters. 95 (2009) 17 - p. , 2009

Link: https://doi.org/10.1063/..

14

Characterization of planar photonic crystals using a quantu..:

Schartner, S. ; Golka, S. ; Austerer, M....
physica status solidi (b). 244 (2007) 8 - p. 2916-2925 , 2007

Link: https://doi.org/10.1002/..

15

Backside interferometric methods for localization of ESD-in..:

Dubec, V. ; Bychikhin, S. ; Pogany, D....
Microelectronics Reliability. 47 (2007) 9-11 - p. 1539-1544 , 2007

Link: https://doi.org/10.1016/..