Graff, Andreas
301  Ergebnisse:
Personensuche X
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2

Fine-Pitch Copper Nanowire Interconnects for 2.5/3D System ..:

Bickel, Steffen ; Quednau, Sebastian ; Birlem, Olav...
Journal of Electronic Materials.  53 (2024)  8 - p. 4410-4420 , 2024
 
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4

Growth defects in heteroepitaxial diamond:

Lebedev, Vadim ; Engels, Jan ; Kustermann, Jan...
Journal of Applied Physics.  129 (2021)  16 - p. , 2021
 
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5

Improved AlScN/GaN heterostructures grown by metal-organic ..:

Manz, Christian ; Leone, Stefano ; Kirste, Lutz...
Semiconductor Science and Technology.  36 (2021)  3 - p. 034003 , 2021
 
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9

Reliability Physics of GaN HEMT Microwave Devices: The Age ..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
 
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10

Atomic Layer Deposition of Cobalt Phosphide for Efficient W..:

Zhang, Haojie ; Hagen, Dirk J. ; Li, Xiaopeng...
Angewandte Chemie International Edition.  59 (2020)  39 - p. 17172-17176 , 2020
 
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15

Interfacial void segregation of Cl in Cu-Sn micro-connects:

Ross, Glenn ; Tao, Xiaoma ; Broas, Mikael...
Electronic Materials Letters.  13 (2017)  4 - p. 307-312 , 2017
 
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