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Gribelyuk, M.
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1

Large Spin Hall Angle in Sputtered BiSb Topological Insulat..:

Huy, H. H. ; Sasaki, J. ; Khang, N. H. D....
IEEE Transactions on Magnetics.  59 (2023)  3 - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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2

High Spin Hall Angle doped BiSbX Topological Insulators usi..:

, In: 2022 IEEE 33rd Magnetic Recording Conference (TMRC),
York, B. ; Hai, P. ; Le, Q.... - p. 1-2 , 2022
Link: https://doi.org/10.1109/..
 
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3

Sample preparation by focused ion beam without argon ion mi..:

Gribelyuk, M. A. ; Mody, J. ; Kaganer, E....
Journal of Applied Physics.  126 (2019)  6 - p. , 2019
Link: https://doi.org/10.1063/..
 
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4

Measurement of SiGe composition in 3-D semiconductor Fin Fi..:

Gribelyuk, M. A. ; Fu, B. ; Zhao, W. W.
Journal of Applied Physics.  125 (2019)  16 - p. , 2019
Link: https://doi.org/10.1063/..
 
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5

How to Avoid Artifacts in Nanobeam Diffraction Strain Measu..:

Fu, B. ; Gribelyuk, M. ; Baumann, Frieder H..
Microscopy and Microanalysis.  23 (2017)  S1 - p. 1420-1421 , 2017
Link: https://doi.org/10.1017/..
 
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6

Advances in Elemental Electron Tomography for the State-of-..:

Fu, B. ; Gribelyuk, M ; Baumann, Frieder H....
Microscopy and Microanalysis.  23 (2017)  S1 - p. 1456-1457 , 2017
Link: https://doi.org/10.1017/..
 
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7

The Influence of Beam Convergence Angle on Channeling Effec..:

Fu, B. ; Gribelyuk, M. ; Scott, R...
Microscopy and Microanalysis.  22 (2016)  S3 - p. 1618-1619 , 2016
Link: https://doi.org/10.1017/..
 
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8

The Combination of STEM Tomography and STEM/EDS Analysis of..:

Fu, B. ; Gribelyuk, M. ; Dumas, L....
Microscopy and Microanalysis.  22 (2016)  S3 - p. 326-327 , 2016
Link: https://doi.org/10.1017/..
 
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9

Electron holography of devices with epitaxial layers:

Gribelyuk, M. A. ; Ontalus, V. ; Baumann, F. H...
Journal of Applied Physics.  116 (2014)  17 - p. , 2014
Link: https://doi.org/10.1063/..
 
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10

Electron Holography of CMOS Devices with Epitaxial Layers:

Gribelyuk, M. A. ; Ontalus, V. ; Adam, T. N...
Microscopy and Microanalysis.  20 (2014)  S3 - p. 252-253 , 2014
Link: https://doi.org/10.1017/..
 
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11

Electron holography of Si:C films and Si:C-based devices:

Gribelyuk, M. A. ; Adam, T. N. ; Ontalus, V....
Journal of Applied Physics.  110 (2011)  6 - p. , 2011
Link: https://doi.org/10.1063/..
 
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12

Interfacial microstructure of NiSix/HfO2/SiOx/Si gate stack:

Gribelyuk, M.A. ; Cabral Jr., C. ; Gusev, E.P..
Thin Solid Films.  515 (2007)  13 - p. 5308-5313 , 2007
Link: https://doi.org/10.1016/..
 
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13

Systematic study of work function engineering and scavengin..:

, In: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest.,
Kim, Y.H. ; Narayanan, V. ; Newbury, J.... - p. 4 pp. , 2005
Link: https://doi.org/10.1109/..
 
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14

In situ investigation of growth and thermal stability of ul..:

Lebedinskii, Yu. Yu. ; Zenkevich, A. ; Gusev, E. P..
Applied Physics Letters.  86 (2005)  19 - p. , 2005
Link: https://doi.org/10.1063/..
 
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15

Electron Holography with Variable Magnification for Semicon..:

Wang, Y-Y ; Domenicucci, A ; Kawasaki, M...
Microscopy and Microanalysis.  11 (2005)  S02 - p. , 2005
Link: https://doi.org/10.1017/..
 
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