E-LIB Suche - Ergebnisse für: Grieb, Tim Jasper

1

Chemische Analyse von GaNAs- und InGaNAs-Schichtstrukturen ..

Physics

Grieb, Tim Jasper , 2013

Exemplare: Zentrale;

2

Characterization of mixing in nanoparticle hetero‐aggregate..:

Mahr, Christoph ; Stahl, Jakob ; Gerken, Beeke...
Nano Select. 5 (2024) 4 - p. , 2024

Link: https://doi.org/10.1002/..

3

GaN atomic electric fields from a segmented STEM detector: ..:

Grieb, Tim ; Krause, Florian F. ; Mehrtens, Thorsten...
Journal of Microscopy. , 2024

Link: https://doi.org/10.1111/..

4

Atomic vs. sub-atomic layer deposition: impact of growth ra..:

Tessarek, Christian ; Grieb, Tim ; Krause, Florian F....
2D Materials. , 2024

Link: https://doi.org/10.1088/..

5

Correlative analysis on InGaN/GaN nanowires: structural and..:

Alonso-Orts, Manuel ; Hötzel, Rudolfo ; Grieb, Tim...
Discover Nano. 18 (2023) 1 - p. , 2023

Link: https://doi.org/10.1186/..

6

Origin of the spectral red-shift and polarization patterns ..:

Ries, Maximilian ; Nippert, Felix ; März, Benjamin...
Nanoscale. 15 (2023) 15 - p. 7077-7085 , 2023

Link: https://doi.org/10.1039/..

7

Dose efficient annular bright field contrast with the ISTEM..:

Krause, Florian F. ; Schowalter, Marco ; Gerken, Beeke...
Ultramicroscopy. 245 (2023) - p. 113661 , 2023

Link: https://doi.org/10.1016/..

8

Material Discrimination in Nanoparticle Hetero‐Aggregates b..:

Gerken, Beeke ; Mahr, Christoph ; Stahl, Jakob...
Particle & Particle Systems Characterization. 40 (2023) 9 - p. , 2023

Link: https://doi.org/10.1002/..

9

Angle-dependence of ADF-STEM intensities for chemical analy..:

Grieb, Tim ; Krause, Florian F. ; Müller-Caspary, Knut...
Ultramicroscopy. 238 (2022) - p. 113535 , 2022

Link: https://doi.org/10.1016/..

10

Deformed Honeycomb Lattices of InGaAs Nanowires Grown on Si..:

Messina, Cristian ; Gong, Yongkang ; Abouzaid, Oumaima...
Advanced Optical Materials. 11 (2022) 5 - p. , 2022

Link: https://doi.org/10.1002/..

11

Towards the interpretation of a shift of the central beam i..:

Mahr, Christoph ; Grieb, Tim ; Krause, Florian F...
Ultramicroscopy. 236 (2022) - p. 113503 , 2022

Link: https://doi.org/10.1016/..

12

Quantitative characterization of nanometer-scale electric f..:

Beyer, Andreas ; Firoozabadi, Saleh ; Heimes, Damien...
Microscopy and Microanalysis. 27 (2021) S1 - p. 2206-2207 , 2021

Link: https://doi.org/10.1017/..

13

Accurate measurement of strain at interfaces in 4D-STEM: A ..:

Mahr, Christoph ; Müller-Caspary, Knut ; Grieb, Tim...
Ultramicroscopy. 221 (2021) - p. 113196 , 2021

Link: https://doi.org/10.1016/..

14

Quantitative Characterization of Nanometer-Scale Electric F..:

Beyer, Andreas ; Munde, Manveer Singh ; Firoozabadi, Saleh...
Nano Letters. 21 (2021) 5 - p. 2018-2025 , 2021

Link: https://doi.org/10.1021/..

15

Accuracy and precision of position determination in ISTEM i..:

Marquardt, Dennis ; Schowalter, Marco ; Krause, Florian F....
Ultramicroscopy. 227 (2021) - p. 113325 , 2021

Link: https://doi.org/10.1016/..