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Gros-Jean, Mickael
198  Ergebnisse:
Personensuche X
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1

p-type NiOx ultrathin film as highly efficient hole extract..:

Zouknak, Louis David Mohgouk ; Gros-Jean, Mickael ; Blonkowski, Serge..
Solid-State Electronics.  212 (2024)  - p. 108836 , 2024
Link: https://doi.org/10.1016/..
 
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2

Highly Microcrystalline Phosphorous‐Doped Si:H Very Thin Fi..:

Wilson, Alestair ; Fourmond, Erwann ; Saidi, Bilel...
physica status solidi (a).  219 (2022)  13 - p. , 2022
Link: https://doi.org/10.1002/..
 
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3

Correlative analysis of embedded silicon interface passivat..:

Aubriet, Valentin ; Courouble, Kristell ; Gros-Jean, Mickael.
Review of Scientific Instruments.  92 (2021)  8 - p. , 2021
Link: https://doi.org/10.1063/..
 
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4

Study of resistive random access memory based on TiN/TaOx/T..:

Diokh, Therese ; Le-Roux, Elise ; Jeannot, Simon...
Thin Solid Films.  533 (2013)  - p. 24-28 , 2013
Link: https://doi.org/10.1016/..
 
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5

Tetragonal Zirconia Stabilization by Metal Addition for Met..:

Ferrand, Julien ; Beugin, Virginie ; Crisci, Alexandre...
ECS Transactions.  58 (2013)  10 - p. 223-233 , 2013
Link: https://doi.org/10.1149/..
 
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6

Investigation on Oxygen Diffusion in a High-k Metal-Gate St..:

Kechichian, Ardem ; Barboux, Philippe ; Gros-Jean, Mickael
ECS Transactions.  58 (2013)  7 - p. 325-338 , 2013
Link: https://doi.org/10.1149/..
 
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7

Modelization of hafnium silicate chemical vapor deposition ..:

Gros-Jean, Mickael ; Bouvet, Philippe ; Graoui, Houda..
Thin Solid Films.  520 (2012)  7 - p. 2594-2599 , 2012
Link: https://doi.org/10.1016/..
 
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8

Flatband Voltage Tuning of HfSiON-Based Gate Stacks: Impact..:

Boujamaa, Rachid ; Baudot, Sylvain ; Martinez, Eugénie...
ECS Transactions.  35 (2011)  4 - p. 805-813 , 2011
Link: https://doi.org/10.1149/..
 
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9

Plasma Enhanced Atomic Layer Deposition of ZrO2: A Thermody..:

Blanquet, Elisabeth ; Monnier, Denis ; Nuta, Ioana...
ECS Transactions.  35 (2011)  4 - p. 497-513 , 2011
Link: https://doi.org/10.1149/..
 
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10

PEALD ZrO2 Films Deposition on TiN and Si Substrates:

Monnier, Denis ; Gros-Jean, Mickael ; Deloffre, Emilie...
ECS Transactions.  25 (2009)  8 - p. 235-241 , 2009
Link: https://doi.org/10.1149/..
 
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11

Method to assess the grain crystallographic orientation wit..:

Gaillard, Nicolas ; Gros-Jean, Mickael ; Mariolle, Denis..
Applied Physics Letters.  89 (2006)  15 - p. , 2006
Link: https://doi.org/10.1063/..
 
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12

In situ electric field simulation in metal/insulator/metal ..:

Gaillard, Nicolas ; Pinzelli, Luc ; Gros-Jean, Mickael.
Applied Physics Letters.  89 (2006)  13 - p. , 2006
Link: https://doi.org/10.1063/..
 
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13

Potential of hydrogenated microcrystalline silicon-germaniu..:

Wilson, Alestair ; Saidi, Bilel ; Gros-Jean, Mickael...
info:eu-repo/semantics/altIdentifier/doi/10.1117/12.2647554.  , 2023
Link: https://hal.science/hal-..
 
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14

Potential of hydrogenated microcrystalline silicon-germaniu..:

Wilson, Alestair ; Saidi, Bilel ; Gros-Jean, Mickael...
info:eu-repo/semantics/altIdentifier/doi/10.1117/12.2647554.  , 2023
Link: https://hal.science/hal-..
 
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15

Potential of hydrogenated microcrystalline silicon-germaniu..:

Wilson, Alestair ; Saidi, Bilel ; Gros-Jean, Mickael...
info:eu-repo/semantics/altIdentifier/doi/10.1117/12.2647554.  , 2023
Link: https://hal.science/hal-..
 
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