Gu, Jiefei
67  Ergebnisse:
Personensuche X
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1

Flip-chip solder bumps defect detection using a self-search..:

Sun, Yu ; Su, Lei ; Gu, Jiefei...
Advanced Engineering Informatics.  60 (2024)  - p. 102395 , 2024
 
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2

X-ray detection of ceramic packaging chip solder defects ba..:

Li, Ke ; Xu, Linhai ; Su, Lei...
NDT & E International.  143 (2024)  - p. 103048 , 2024
 
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4

Category-level selective dual-adversarial network using sig..:

Zhang, Siyu ; Su, Lei ; Gu, Jiefei...
Expert Systems with Applications.  238 (2024)  - p. 121879 , 2024
 
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5

Rotating machinery fault detection and diagnosis based on d..:

ZHANG, Siyu ; SU, Lei ; GU, Jiefei...
Chinese Journal of Aeronautics.  36 (2023)  1 - p. 45-74 , 2023
 
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6

A Novel Three-Probability Spaces Logic Decoupling Distillat..:

Sun, Yu ; Su, Lei ; Gu, Jiefei..
IEEE Transactions on Instrumentation and Measurement.  72 (2023)  - p. 1-10 , 2023
 
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8

An improved orthogonal matching pursuit method for denoisin..:

Su, Lei ; Tan, Shihong ; Qi, Yang...
Mechanical Systems and Signal Processing.  188 (2023)  - p. 110030 , 2023
 
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12

A novel approach for flip chip inspection based on improved..:

Su, Lei ; Zhang, SiYu ; Ji, Yong...
Science China Technological Sciences.  65 (2022)  5 - p. 1087-1097 , 2022
 
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15

Visual inspection of steel surface defects based on domain ..:

Zhang, Siyu ; Zhang, Qiuju ; Gu, Jiefei...
Mechanical Systems and Signal Processing.  153 (2021)  - p. 107541 , 2021
 
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