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X
Guarin, F.
144  Ergebnisse:
Personensuche X
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1

RF long term aging behavior and reliability in 22FDX WiFi P..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Srinivasan, P. ; Lestage, J. ; Syed, S.... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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2

Superior Reliability and Low Self-Heating of a 45nm CMOS 39..:

, In: 2022 IEEE Radio Frequency Integrated Circuits Symposium (RFIC),
Srinivasan, P. ; Syed, S. ; Sundaram, J. A.... - p. 195-198 , 2022
Link: https://doi.org/10.1109/..
 
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3

PNS101 COLLABORATIVE APPROACHES TO ATTAIN HEALTHCARE SUSTAI..:

Guarin, D.F. ; Chavez, R. ; Trujillo de Hart, J.C....
Value in Health.  23 (2020)  - p. S302 , 2020
Link: https://doi.org/10.1016/..
 
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4

Thermal Characterization and TCAD Modeling of a Power Ampli..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Paliwoda, P. ; Rabie, M.A. ; Restrepo, O.D.... - p. 1-5 , 2020
Link: https://doi.org/10.1109/..
 
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5

Self-heating characterization and its applications in techn..:

, In: 2020 IEEE 29th North Atlantic Test Workshop (NATW),
Paliwoda, P. ; Toledano-Luque, M. ; Nigam, T.... - p. 1-7 , 2020
Link: https://doi.org/10.1109/..
 
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6

Silicon Based RF Reliability Challenges for 5G Communicatio..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Colestock, P. ; Srinivasan, P. ; Guarin, F. - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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7

A novel methodology to evaluate RF reliability for SOI CMOS..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Srinivasan, P. ; Colestock, P. ; Samuels, T.... - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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8

RE2 Definiendo "Valor" en Latinoamérica: Lo bueno, lo malo ..:

Alfonso-Cristancho, R. ; Brabata, C. ; Gilardino, R....
Value in Health Regional Issues.  19 (2019)  - p. S84 , 2019
Link: https://doi.org/10.1016/..
 
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9

RE4 PROPOSED SOLUTIONS TO ACHIEVING HEALTHCARE SUSTAINABILI..:

Guarin, D.F. ; Matus, A. ; Toro, W....
Value in Health Regional Issues.  19 (2019)  - p. S84-S85 , 2019
Link: https://doi.org/10.1016/..
 
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10

Reliability Considerations for the Qualification of Leading..:

, In: 2019 19th International Workshop on Junction Technology (IWJT),
Guarin, F. - p. 1-3 , 2019
Link: https://doi.org/10.23919..
 
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11

PHP180 - ACCESS AND VALUE OF HEALTHCARE INNOVATION IN LATIN..:

Martin de Bustamante, M. ; Martin de Bustamante, M. ; Alfonso, R...
Value in Health.  21 (2018)  - p. S180 , 2018
Link: https://doi.org/10.1016/..
 
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12

Evolution of the gate current in 32 nm MOSFETs under irradi..:

Palumbo, F. ; Debray, M. ; Vega, N....
Solid-State Electronics.  119 (2016)  - p. 19-24 , 2016
Link: https://doi.org/10.1016/..
 
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13

Magneto-modulation of gate leakage current in 65nm nMOS tra..:

Gutierrez-D, E.A. ; Molina-R, J. ; Garcia-R, P...
Solid-State Electronics.  54 (2010)  9 - p. 1022-1026 , 2010
Link: https://doi.org/10.1016/..
 
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14

Magnetic field induced gate leakage current in 65nm nMOS tr..:

, In: 2009 Proceedings of the European Solid State Device Research Conference,
Gutierrez-D, Edmundo A. ; Molina-R, J. ; Garcia-R., P. J... - p. None , 2009
Link: https://doi.org/10.1109/..
 
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15

New contact system in crude oil desalting process; Nuevo si..:

Forero, J. ; Duque, J. ; Diaz, J....
CT&F - Ciencia, Tecnología y Futuro.  2 (2001)  2 - p. 81-91 , 2001
Link: https://doi.org/10.29047..
 
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