E-LIB Suche - Ergebnisse für: Gueorguiev, V. K.

1

Silicon ion implanted PMMA for soft electronics:

Hadjichristov, G.B. ; Gueorguiev, V.K. ; Ivanov, Tz.E....
Organic Electronics. 9 (2008) 6 - p. 1051-1060 , 2008

2

Influence of MeV electron irradiation on the properties of ..:

Aleksandrova, P.V. ; Gueorguiev, V.K. ; Ivanov, Tz.E..
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 243 (2006) 2 - p. 340-344 , 2006

Link: https://doi.org/10.1016/..

3

Poole-Frenkel conduction in Al/ZrO2 /SiO 2 /Si structures:

Aleskandrova, P. V. ; Gueorguiev, V. K. ; Ivanov, Tz. E..
The European Physical Journal B - Condensed Matter and Complex Systems. 52 (2006) 4 - p. 453-457 , 2006

Link: https://doi.org/10.1140/..

4

Influence of high energy electron irradiation on the charac..:

Aleksandrova, P. V. ; Gueorguiev, V. K. ; Ivanov, Tz. E..
The European Physical Journal B. 52 (2006) 3 - p. 355-359 , 2006

Link: https://doi.org/10.1140/..

5

Electrical and Polarization Properties of Nano-Sized ZrO2 o..:

, In: Functional Properties of Nanostructured Materials; NATO Science Series II: Mathematics, Physics and Chemistry,

Aleksandrova, P. V. ; Gueorguiev, V. K. ; Ivanov, TZ. E.. - p. 355-358 , 2006

Link: https://doi.org/10.1007/..

6

TEM structural characterization of Sn–Te–O thin films on mo..:

Popova, L.I ; Peneva, S.K ; Dimitriadis, C.A..
Thin Solid Films. 441 (2003) 1-2 - p. 25-31 , 2003

Link: https://doi.org/10.1016/..

7

Effects of gamma-ray irradiation on polycrystalline silicon..:

Hastas, N.A. ; Dimitriadis, C.A. ; Brini, J....
Microelectronics Reliability. 43 (2003) 1 - p. 57-60 , 2003

Link: https://doi.org/10.1016/..

8

Gas-sensitivity of SnO2 layers treated by rapid thermal ann..:

Andreev, S.K ; Popova, L.I ; Gueorguiev, V.K..
Materials Science and Engineering: B. 83 (2001) 1-3 - p. 223-226 , 2001

Link: https://doi.org/10.1016/..

9

Time-dependent-dielectric-breakdown of hydrogen implanted p..:

Gueorguiev, V.K. ; Ivanov, Tz.E. ; Dimitriadis, C.A...
Microelectronics Journal. 32 (2001) 4 - p. 301-304 , 2001

Link: https://doi.org/10.1016/..

10

Empirical relationship between low-frequency drain current ..:

Angelis, C. T. ; Dimitriadis, C. A. ; Farmakis, F. V....
Applied Physics Letters. 76 (2000) 1 - p. 118-120 , 2000

Link: https://doi.org/10.1063/..

11

Oxide field enhancement corrected time dependent dielectric..:

Gueorguiev, V.K ; Ivanov, Tz.E ; Dimitriadis, C.A..
Microelectronics Journal. 31 (2000) 8 - p. 663-666 , 2000

Link: https://doi.org/10.1016/..

12

Electron trapping probabilities in hydrogen ion implanted s..:

Gueorguiev, V.K ; Ivanov, Tz.E ; Dimitriadis, C.A..
Microelectronics Journal. 31 (2000) 3 - p. 207-211 , 2000

Link: https://doi.org/10.1016/..

13

Photon emission and related hot-carrier effects in polycrys..:

Farmakis, F. V. ; Dimitriadis, C. A. ; Brini, J....
Journal of Applied Physics. 85 (1999) 9 - p. 6917-6919 , 1999

Link: https://doi.org/10.1063/..

14

Hot-carrier phenomena in high temperature processed undoped..:

Farmakis, F.V ; Dimitriadis, C.A ; Brini, J...
Solid-State Electronics. 43 (1999) 7 - p. 1259-1266 , 1999

Link: https://doi.org/10.1016/..

15

Leakage current variation during two different modes of ele..:

Farmakis, F.V. ; Brini, J. ; Kamarinos, G....
Microelectronics Reliability. 39 (1999) 6-7 - p. 885-889 , 1999

Link: https://doi.org/10.1016/..