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Guerrero-Balaguera, Juan-David
61  Ergebnisse:
Personensuche X
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1

Special Session: Reliability Assessment Recipes for DNN Acc..:

, In: 2024 IEEE 42nd VLSI Test Symposium (VTS),
Ahmadilivani, Mohammad Hasan ; Bosio, Alberto ; Deveautour, Bastien... - p. 1-11 , 2024
Link: https://doi.org/10.1109/..
 
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2

Evaluating the Reliability of Supervised Compression for Sp..:

, In: 2024 IEEE 42nd VLSI Test Symposium (VTS),
Guerrero-Balaguera, Juan-David ; Condia, Josie E. Rodriguez ; Levorato, Marco. - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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3

Assessing the Reliability of Different Split Computing Neur..:

, In: 2024 IEEE 25th Latin American Test Symposium (LATS),
Esposito, Giuseppe ; Guerrero-Balaguera, Juan-David ; Condia, Josie E. Rodriguez.. - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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4

Investigating and Reducing the Architectural Impact of Tran..:

Rodriguez Condia, Josie E. ; Guerrero-Balaguera, Juan-David ; Patiño Núñez, Edwar J...
Journal of Electronic Testing.  40 (2024)  2 - p. 215-228 , 2024
Link: https://doi.org/10.1007/..
 
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5

Analyzing the Impact of Scheduling Policies on the Reliabil..:

, In: 2024 IEEE 42nd VLSI Test Symposium (VTS),
Sierra, Robert Limas ; Guerrero-Balaguera, Juan-David ; Pessia, Francesco.. - p. 1-7 , 2024
Link: https://doi.org/10.1109/..
 
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6

Analyzing the Structural and Operational Impact of Faults i..:

, In: 2024 IEEE European Test Symposium (ETS),
Condia, Josie E. Rodriguez ; Guerrero-Balaguera, Juan-David ; Sierra, Robert Limas. - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
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7

Exploring Hardware Fault Impacts on Different Real Number R..:

Limas Sierra, Robert ; Guerrero-Balaguera, Juan-David ; Condia, Josie E. Rodriguez.
Electronics.  13 (2024)  3 - p. 578 , 2024
Link: https://doi.org/10.3390/..
 
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8

An Integrated Environment for the Reliability Assessment of..:

, In: 2024 IEEE 25th Latin American Test Symposium (LATS),
Mesa, Luis Ariel ; Guerrero-Balaguera, Juan-David ; Castaneda, Erika D... - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
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9

Reliability Estimation of Split DNN Models for Distributed ..:

, In: 2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE),
Guerrero-Balaguera, Juan-David ; Harshbarger, Ian A. ; Condia, Josie E. Rodriguez.. - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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10

A Reliability-aware Environment for Design Exploration for ..:

, In: 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS),
Sierra, Robert Limas ; Guerrero-Balaguera, Juan-David ; Rodriguez Condia, Josie E.. - p. 169-174 , 2023
Link: https://doi.org/10.1109/..
 
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11

Understanding the Effects of Permanent Faults in GPU's Para..:

, In: SC23: International Conference for High Performance Computing, Networking, Storage and Analysis,
Guerrero-Balaguera, Juan-David ; Condia, Josie E. Rodriguez ; dos Santos, Fernando F... - p. 1-15 , 2023
Link: https://doi.org/10.1145/..
 
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12

Characterizing a Neutron-Induced Fault Model for Deep Neura..:

Santos, Fernando Fernandes dos ; Kritikakou, Angeliki ; Condia, Josie E. Rodriguez...
IEEE Transactions on Nuclear Science.  70 (2023)  4 - p. 370-380 , 2023
Link: https://doi.org/10.1109/..
 
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13

Evaluating the Prevalence of SFUs in the Reliability of GPU:

, In: 2023 IEEE European Test Symposium (ETS),
Rodriguez Condia, Josie E. ; Guerrero-Balaguera, Juan-David ; Patino Nunez, Edwar J... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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14

Analyzing the Impact of Different Real Number Formats on th..:

, In: 2023 IFIP/IEEE 31st International Conference on Very Large Scale Integration (VLSI-SoC),
Sierra, Robert Limas ; Guerrero-Balaguera, Juan-David ; Rodriguez Condia, Josie E.. - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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15

Analyzing the Architectural Impact of Transient Fault Effec..:

, In: 2023 IEEE 24th Latin American Test Symposium (LATS),
Rodriguez Condia, Josie E. ; Guerrero-Balaguera, Juan-David ; Patino Nunez, Edwar J... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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