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Gutiérrez-D., Edmundo A.
95  Ergebnisse:
Personensuche X
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1

Assessing Non-Conducting Off-State Induced Hard Breakdown f..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Otero-Carrascal, Alan Y. ; Chaparro-Ortiz, Dora A. ; Gutierrez-D, Edmundo A.... - p. P53.RF-1-P53.RF-7 , 2024
Link: https://doi.org/10.1109/..
 
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2

Numerical Simulations of Space Charge Waves Amplification U..:

Garcia-Barrientos, Abel ; Nikolova, Natalia ; Filipovic, Lado...
Crystals.  13 (2023)  9 - p. 1398 , 2023
Link: https://doi.org/10.3390/..
 
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3

n-MOS Transistor Impact Ionization Boosted by Cumulative St..:

Gutiérrez-D., Edmundo A. ; Otero C., Alan Y. ; Xiomara Ribero, F.
IEEE Journal of the Electron Devices Society.  11 (2023)  - p. 681-686 , 2023
Link: https://doi.org/10.1109/..
 
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4

Impact of Non-Conducting HCI Degradation on Small-Signal Pa..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Chaparro-Ortiz, Dora A. ; Otero-Carrascal, Alan Y. ; Gutierrez-D., Edmundo A.... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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5

Parameter extraction in a 65nm nMOSFET technology from 300 ..:

, In: 2022 IEEE Latin American Electron Devices Conference (LAEDC),
Lopez-L, O. ; Martinez-R, I. ; Durini, D.... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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6

DC and 28 GHz Reliability of a SOI FET Technology:

Gutierrez-D., Edmundo A. ; Mendez-V., Jairo ; Tinoco, Julio C...
IEEE Journal of the Electron Devices Society.  8 (2020)  - p. 385-390 , 2020
Link: https://doi.org/10.1109/..
 
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7

Stress- and Trap-Induced Body Fluctuations in 45nm SOI MOSF..:

, In: 2020 IEEE Latin America Electron Devices Conference (LAEDC),
Gutierrez-D, Edmundo A. ; Huerta, Oscar ; Lopez-L, Omar - p. 1-3 , 2020
Link: https://doi.org/10.1109/..
 
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8

Systematic Characterization of Random Telegraph Noise and I..:

, In: Noise in Nanoscale Semiconductor Devices,
Marquez, Carlos ; Huerta, Oscar ; Tec-Chim, Adrian I.... - p. 135-174 , 2020
Link: https://doi.org/10.1007/..
 
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9

Nano-scaled semiconductor devices: physics, modelling and c.. 

Materials, circuits and devices series, 27
Gutierrez-D., Edmundo A , 2016
Link: https://search.ebscohost..
 
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10

Improved Detection of Magnetic Signals by a MEMS Sensor Usi..:

Herrera-May, Agustín L. ; Tapia, Jesus A. ; Domínguez-Nicolás, Saúl M....
PLoS ONE.  9 (2014)  10 - p. e109534 , 2014
Link: https://doi.org/10.1371/..
 
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11

Respiratory Magnetogram Detected with a MEMS Device:

Dominguez-Nicolas, Saul M. ; Juarez-Aguirre, Raul ; Herrera-May, Agustin L....
International Journal of Medical Sciences.  10 (2013)  11 - p. 1445-1450 , 2013
Link: https://doi.org/10.7150/..
 
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12

Analysis of the impact of the drain-junction tunneling effe..:

Torres-Rios, Emmanuel ; Torres-Torres, Reydezel ; Gutiérrez-D, Edmundo A.
Solid-State Electronics.  53 (2009)  2 - p. 145-149 , 2009
Link: https://doi.org/10.1016/..
 
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13

Magnetic field induced gate leakage current in 65nm nMOS tr..:

, In: 2009 Proceedings of the European Solid State Device Research Conference,
Gutierrez-D, Edmundo A. ; Molina-R, J. ; Garcia-R., P. J... - p. None , 2009
Link: https://doi.org/10.1109/..
 
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14

RF magnetic emission and electrical coupling in silicon int..:

, In: 2008 7th International Caribbean Conference on Devices, Circuits and Systems,
Gutierrez-D., Edmundo A. ; Garcia-R., Pedro - p. None , 2008
Link: https://doi.org/10.1109/..
 
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15

Formation of n and p Regions in (114) and (5 5 12)-Silicon ..:

De la Hidalga-W, F. Javier ; Rosales-Q, Pedro ; Torres-J, Alfonso...
ECS Transactions.  6 (2007)  13 - p. 29-33 , 2007
Link: https://doi.org/10.1149/..
 
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