Häusler, I
162  Ergebnisse:
Personensuche X
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1

Charge-Trapping-Induced Compensation of the Ferroelectric P..:

Fontanini, R. ; Segatto, M. ; Nair, K. S....
IEEE Transactions on Electron Devices.  69 (2022)  7 - p. 3694-3699 , 2022
 
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4

Volume Fraction Determination of Discretely Oriented Disc-S..:

Häusler, I.
Practical Metallography.  54 (2017)  12 - p. 816-837 , 2017
 
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6

Shape Recognition of Nanoparticles by High-Resolution SEM a..:

Ortel, E. ; Pellutie, L. ; Pellegrino, F....
Microscopy and Microanalysis.  21 (2015)  S3 - p. 2401-2402 , 2015
 
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14

Structural Investigations of "Ferecrystals" by Scanning Nan..:

Kirmse, H ; Grosse, C ; Häusler, I...
Microscopy and Microanalysis.  17 (2011)  S2 - p. 1070-1071 , 2011
 
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15

Quantitative Analysis of Chemical Composition Using HAADF-S..:

Fritz, R ; Beyer, A ; Stolz, W...
Microscopy and Microanalysis.  17 (2011)  S2 - p. 1410-1411 , 2011
 
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