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2023 35th International Conference on Microelectronic Test Structure (ICMTS) ,
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Static and LFN/RTN Local and Global Variability Analysis Us..:
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2023 International Conference on Noise and Fluctuations (ICNF) ,
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Applicability of the Carrier Number Fluctuations Model for ..:
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2022 International Electron Devices Meeting (IEDM) ,
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18nm FDSOI Enhanced Device Platform for ULP/ULL MCUs:
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2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) ,
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