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Haendler, S.
84  Ergebnisse:
Personensuche X
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1

Low Frequency Noise Study of X-ray Irradiated Si/SiGe:C BiC..:

, In: 2023 International Conference on Noise and Fluctuations (ICNF),
Belie, A. Adebabay ; El Beyrouthy, J. ; Pascal, F.... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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2

Variability of Trap-induced Mobility Fluctuations in Nanosc..:

, In: 2023 International Electron Devices Meeting (IEDM),
Gauthier, O. ; Haendler, S. ; Rafhay, Q.. - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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3

Hot-carrier evaluation of a zero-cost transistor developed ..:

Devoge, P. ; Aziza, H. ; Lorenzini, P....
Microelectronics Reliability.  126 (2021)  - p. 114265 , 2021
Link: https://doi.org/10.1016/..
 
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4

Intrinsic ESD robustness on new high voltage N/PMOS devices..:

Galy, Ph. ; Jacquier, B. ; Haendler, S.
Microelectronics Reliability.  126 (2021)  - p. 114370 , 2021
Link: https://doi.org/10.1016/..
 
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5

Variability Evaluation of 28nm FD-SOI Technology at Cryogen..:

, In: 2020 IEEE Symposium on VLSI Technology,
Paz, B. Cardoso ; Guevel, L. Le ; Casse, M.... - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
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6

Impact of Gamma irradiation on advanced Si/SiGe:C BiCMOS te..:

, In: 2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
El Beyrouthy, J. ; Sagnes, B. ; Pascal, F.... - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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7

Effects of Total Ionizing Dose on 1-V and Low Frequency Noi..:

, In: 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
El Beyrouthy, J. ; Vauthelin, A. ; Seif, M.... - p. 01-04 , 2019
Link: https://doi.org/10.1109/..
 
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8

28nm FDSOI Platform with Embedded PCM for IoT, ULP, Digital..:

, In: ESSCIRC 2019 - IEEE 45th European Solid State Circuits Conference (ESSCIRC),
ARNAUD, F. ; HAENDLER, S. ; CLERC, S.... - p. 7-10 , 2019
Link: https://doi.org/10.1109/..
 
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9

Drain current local variability from linear to saturation r..:

Karatsori, T.A. ; Theodorou, C.G. ; Haendler, S...
Solid-State Electronics.  128 (2017)  - p. 31-36 , 2017
Link: https://doi.org/10.1016/..
 
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10

Low frequency noise variability in ultra scaled FD-SOI n-MO..:

Theodorou, C.G. ; Ioannidis, E.G. ; Haendler, S....
Solid-State Electronics.  117 (2016)  - p. 88-93 , 2016
Link: https://doi.org/10.1016/..
 
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11

Characterization and modeling of drain current local variab..:

Ioannidis, E.G. ; Haendler, S. ; Josse, E...
Solid-State Electronics.  118 (2016)  - p. 4-11 , 2016
Link: https://doi.org/10.1016/..
 
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12

Hot-carrier degradation model for nanoscale ultra-thin body..:

Karatsori, T.A. ; Theodorou, C.G. ; Haendler, S....
Microelectronic Engineering.  159 (2016)  - p. 9-16 , 2016
Link: https://doi.org/10.1016/..
 
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13

Full gate voltage range Lambert-function based methodology ..:

Karatsori, T.A. ; Theodorou, C.G. ; Ioannidis, E.G....
Solid-State Electronics.  111 (2015)  - p. 123-128 , 2015
Link: https://doi.org/10.1016/..
 
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14

Dispersion study of DC and Low Frequency Noise in SiGe:C He..:

Seif, M. ; Pascal, F. ; Sagnes, B....
Microelectronics Reliability.  54 (2014)  9-10 - p. 2171-2175 , 2014
Link: https://doi.org/10.1016/..
 
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15

Impact of low‐frequency noise variability on statistical pa..:

Ioannidis, E.G. ; Theodorou, C.G. ; Haendler, S...
Electronics Letters.  50 (2014)  19 - p. 1393-1395 , 2014
Link: https://doi.org/10.1049/..
 
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