E-LIB Suche - Ergebnisse für: Haenssler, Olaf C.

1

Evaluation of the Systematic Error for Scanning Microwave M..:

, In: 2022 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO),

Gaudet, Matthieu ; Mead, James ; Haenssler, Olaf C.. - p. 1-3 , 2022

Link: https://doi.org/10.1109/..

2

Amplitude-Phase Variation in a Graphene-Based Microstrip Li..:

Yasir, Muhammad ; Fatikow, Sergej ; Haenssler, Olaf C.
Micromachines. 13 (2022) 7 - p. 1039 , 2022

Link: https://doi.org/10.3390/..

3

Reduction of graphene oxide and graphene quantum dots using..:

Jovanovic, Svetlana ; Haenssler, Olaf C. ; Budimir, Milica...
Resolution and Discovery. 5 (2020) 1 - p. 1-4 , 2020

Link: https://doi.org/10.1556/..

4

Towards Robot-based Manipulation, Characterization and Auto..:

, In: 2019 International Conference on Industrial Engineering, Applications and Manufacturing (ICIEAM),

Fatikow, Sergej ; Bartenwerfer, Malte ; Haenssler, Olaf C. - p. 1-5 , 2019

Link: https://doi.org/10.1109/..

5

Multi-target tracking for automated RF on-wafer probing bas..:

, In: 2019 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS),

Li, Hai ; von Kleist-Retzow, Fabian T. ; Haenssler, Olaf C... - p. 1-6 , 2019

Link: https://doi.org/10.1109/..

6

Multimodal microscopy test standard for scanning microwave,..:

Haenssler, Olaf C. ; Wieghaus, M. F. ; Kostopoulos, A....
Journal of Micro-Bio Robotics. 14 (2018) 3-4 - p. 51-57 , 2018

Link: https://doi.org/10.1007/..

7

Amplitude-Phase Variation in a Graphene-Based Microstrip Li..:

Yasir, Muhammad ; Fatikow, Sergej ; Haenssler, Olaf C
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC9322433/. , 2022

Link: http://www.ncbi.nlm.nih...

8

Electromagnetic Modeling in Near-Field Scanning Microwave M..:

Polovodov, Petr ; Brillard, Charlene ; Haenssler, Olaf, C...
info:eu-repo/semantics/altIdentifier/doi/10.1109/NEMO.2018.8503487. , 2018

Link: https://hal.science/hal-..

9

Multimodal imaging technology by integrated scanning electr..:

Haenssler, Olaf, C ; Fatikow, Sergej ; Theron, Didier
info:eu-repo/semantics/altIdentifier/doi/10.1116/1.5006161. , 2018

Link: https://hal.science/hal-..

10

Electromagnetic Modeling in Near-Field Scanning Microwave M..:

Polovodov, Petr ; Brillard, Charlene ; Haenssler, Olaf, C...
info:eu-repo/semantics/altIdentifier/doi/10.1109/NEMO.2018.8503487. , 2018

Link: https://hal.science/hal-..

11

Multimodal imaging technology by integrated scanning electr..:

Haenssler, Olaf, C ; Fatikow, Sergej ; Theron, Didier
info:eu-repo/semantics/altIdentifier/doi/10.1116/1.5006161. , 2018

Link: https://hal.science/hal-..

12

Electromagnetic Modeling in Near-Field Scanning Microwave M..:

Polovodov, Petr ; Brillard, Charlene ; Haenssler, Olaf, C...
info:eu-repo/semantics/altIdentifier/doi/10.1109/NEMO.2018.8503487. , 2018

Link: https://hal.science/hal-..

13

Multimodal imaging technology by integrated scanning electr..:

Haenssler, Olaf, C ; Fatikow, Sergej ; Theron, Didier
info:eu-repo/semantics/altIdentifier/doi/10.1116/1.5006161. , 2018

Link: https://hal.science/hal-..

14

Memristor Device Characterization by Scanning Microwave Mic..:

Sassine, Gilbert ; Najjari, N ; Brillard, Charlene...
info:eu-repo/semantics/altIdentifier/doi/10.1109/MARSS.2017.8016537. , 2017

Link: https://hal.science/hal-..

15

Memristor Device Characterization by Scanning Microwave Mic..:

Sassine, Gilbert ; Najjari, N ; Brillard, Charlene...
info:eu-repo/semantics/altIdentifier/doi/10.1109/MARSS.2017.8016537. , 2017

Link: https://hal.science/hal-..