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Hantschel, T.
50  Ergebnisse:
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1

Enabling focused ion beam sample preparation for applicatio..:

Lagrain, P. ; Paulussen, K. ; Grieten, E....
Micro and Nano Engineering.  23 (2024)  - p. 100247 , 2024
Link: https://doi.org/10.1016/..
 
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2

Self-patterned ultra-sharp diamond tips and their applicati..:

Wouters, L. ; Boehme, T. ; Mana, L..
Micro and Nano Engineering.  19 (2023)  - p. 100195 , 2023
Link: https://doi.org/10.1016/..
 
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3

Scanning tunneling microscopy for imaging and quantificatio..:

Rybalchenko, Y. ; Minj, A. ; Medina, H....
Solid-State Electronics.  209 (2023)  - p. 108781 , 2023
Link: https://doi.org/10.1016/..
 
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4

Reverse tip sample scanning for precise and high-throughput..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Celano, U. ; Hantschel, T. ; Boehme, T.... - p. 5.1.1-5.1.4 , 2019
Link: https://doi.org/10.1109/..
 
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5

Outwitting the series resistance in scanning spreading resi..:

Schulze, A. ; Cao, R. ; Eyben, P...
Ultramicroscopy.  161 (2016)  - p. 59-65 , 2016
Link: https://doi.org/10.1016/..
 
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6

Diamond scanning probes with sub-nanometer resolution for a..:

Hantschel, T. ; Tsigkourakos, M. ; Zha, L....
Microelectronic Engineering.  159 (2016)  - p. 46-50 , 2016
Link: https://doi.org/10.1016/..
 
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7

Overcoated diamond tips for nanometer-scale semiconductor d..:

Hantschel, T. ; Tsigkourakos, M. ; Kluge, J....
Microelectronic Engineering.  141 (2015)  - p. 1-5 , 2015
Link: https://doi.org/10.1016/..
 
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8

Scanning spreading resistance microscopy for electrical cha..:

Xu, Zheng ; Hantschel, T. ; Tsigkourakos, M..
physica status solidi (a).  212 (2015)  11 - p. 2578-2582 , 2015
Link: https://doi.org/10.1002/..
 
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9

Edge-enhanced Raman scattering in narrow sGe fin field-effe..:

Nuytten, T. ; Hantschel, T. ; Kosemura, D....
Applied Physics Letters.  106 (2015)  3 - p. , 2015
Link: https://doi.org/10.1063/..
 
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10

Diamond nanoprobes for electrical probing of nanoelectronic..:

Hantschel, T. ; Clarysse, T. ; Ajaykumar, A....
Microelectronic Engineering.  121 (2014)  - p. 19-23 , 2014
Link: https://doi.org/10.1016/..
 
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11

Rippling on Wear Scar Surfaces of Nanocrystalline Diamond F..:

Podgursky, V. ; Hantschel, T. ; Bogatov, A....
Tribology Letters.  55 (2014)  3 - p. 493-501 , 2014
Link: https://doi.org/10.1007/..
 
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12

Quantitative three-dimensional carrier mapping in nanowire-..:

Schulze, A. ; Hantschel, T. ; Eyben, P....
Ultramicroscopy.  125 (2013)  - p. 18-23 , 2013
Link: https://doi.org/10.1016/..
 
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13

Initial growth stages of heavily boron‐doped HFCVD diamond ..:

Simon, D. K. ; Tsigkourakos, M. ; Hantschel, T...
physica status solidi (a).  210 (2013)  10 - p. 2002-2007 , 2013
Link: https://doi.org/10.1002/..
 
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14

Nanoprober-based EBIC measurements for nanowire transistor ..:

Arstila, K. ; Hantschel, T. ; Schulze, A....
Microelectronic Engineering.  105 (2013)  - p. 99-102 , 2013
Link: https://doi.org/10.1016/..
 
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15

TiN scanning probes for electrical profiling of nanoelectro..:

Hantschel, T. ; Schulze, A. ; Celano, U....
Microelectronic Engineering.  97 (2012)  - p. 255-258 , 2012
Link: https://doi.org/10.1016/..
 
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