E-LIB Suche - Ergebnisse für: Haonan, Feng

1

Study of heavy ion induced single event gate rupture effect..:

Xiaowen, Liang ; Haonan, Feng ; Xiaojuan, Pu...
Japanese Journal of Applied Physics. 61 (2022) 8 - p. 084002 , 2022

2

NIMCE: a gene regulatory network inference approach based o..:

Haonan, Feng ; Zheng, Ruiqing ; Wang, Jianxin..
IEEE/ACM Transactions on Computational Biology and Bioinformatics. , 2020

Link: https://doi.org/10.1109/..

3

Study on the fabrication and performance of hierarchical po..:

Liang, Junjie ; Lian, Xiaojie ; Lu, Yi...
Materials Today Communications. 39 (2024) - p. 108637 , 2024

Link: https://doi.org/10.1016/..

4

Mechanistic modelling of relative biological effectiveness ..:

Feng, Haonan ; Li, Weiguang ; Zhang, Yibao...
Physics in Medicine & Biology. 69 (2024) 3 - p. 035020 , 2024

Link: https://doi.org/10.1088/..

5

Charge Transport in Blue Quantum Dot Light‐Emitting Diodes:

Li, Shuxin ; Lin, Wenxin ; Feng, Haonan...
Advanced Electronic Materials. , 2024

Link: https://doi.org/10.1002/..

6

Harnessing oriented arrangement of collagen fibers by 3D pr..:

Zhou, Yi ; Lian, Xiao-Jie ; Lu, Yi...
Biomedical Materials. 19 (2024) 4 - p. 045020 , 2024

Link: https://doi.org/10.1088/..

7

Study of pristine and degraded blue quantum dot light-emitt..:

Lin, Wenxin ; Huang, Jiangxia ; Li, Shuxin...
Journal of Applied Physics. 135 (2024) 4 - p. , 2024

Link: https://doi.org/10.1063/..

8

Refined Analysis of Leakage Current in SiC Power Metal Oxid..:

Xiang, Yutang ; Liang, Xiaowen ; Feng, Jie...
Electronics. 12 (2023) 20 - p. 4349 , 2023

Link: https://doi.org/10.3390/..

9

A decrease in TDDB Lifetime of Commercial SiC power MOSFETs..:

, In: 2022 19th China International Forum on Solid State Lighting & 2022 8th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS),

Yang, Sheng ; Feng, Haonan ; Yu, Xuefeng. - p. 38-42 , 2023

Link: https://doi.org/10.1109/..

10

Analog circuit fault diagnosis based on enhanced Harris Haw..:

Feng, Haonan ; Li, Gang ; Yu, Jianjie..
Engineering Reports. 5 (2023) 6 - p. , 2023

Link: https://doi.org/10.1002/..

11

Oxide Electric Field-Induced Degradation of SiC MOSFET for ..:

Liang, Xiaowen ; Feng, Haonan ; Xiang, Yutang...
Electronics. 12 (2023) 13 - p. 2886 , 2023

Link: https://doi.org/10.3390/..

12

Multi-stage collaborative resilient enhancement strategy fo..:

Liu, Yanli ; Feng, Haonan ; Hatziargyriou, Nikos D.
Applied Energy. 348 (2023) - p. 121560 , 2023

Link: https://doi.org/10.1016/..

13

FIDO Gets Verified: A Formal Analysis of the Universal Auth..:

Feng, Haonan ; Guan, Jingjing ; Li, Hui..
IEEE Transactions on Dependable and Secure Computing. 20 (2023) 5 - p. 4291-4310 , 2023

Link: https://doi.org/10.1109/..

14

Effect of topical antibiotics on the prevention and managem..:

Zhang, Meixue ; Feng, Haonan ; Gao, Yongtao..
International Wound Journal. 20 (2023) 10 - p. 4015-4022 , 2023

Link: https://doi.org/10.1111/..

15

Total ionizing dose effects of 60Co-γ ray radiation on SiC ..:

Feng, Haonan ; Liang, Xiaowen ; Sun, Jing...
Radiation Effects and Defects in Solids. , 2023

Link: https://doi.org/10.1080/..