E-LIB Suche - Ergebnisse für: Hartfield, Cheryl

1

Laser Ablation: A New Approach to APT Specimen Preparation:

Hestad, Samantha ; Pérez-Willard, Fabián ; Hartfield, Cheryl...
Microscopy and Microanalysis. 28 (2022) S1 - p. 50-51 , 2022

Link: https://doi.org/10.1017/..

2

Emerging Technologies for Advanced 3D Package Characterizat..:

Hartfield, Cheryl ; Harris, Will ; Gu, Allen...
ECS Transactions. 109 (2022) 2 - p. 15-29 , 2022

Link: https://doi.org/10.1149/..

3

New physical analysis capability for counterfeit electronic..:

, In: 2020 IEEE Physical Assurance and Inspection of Electronics (PAINE),

Johnson, Greg M. ; Hartfield, Cheryl ; Mueller, Sascha. - p. 1-5 , 2020

Link: https://doi.org/10.1109/..

4

The LaserFIB: new application opportunities combining a hig..:

Tordoff, Ben ; Hartfield, Cheryl ; Holwell, Andrew J....
Applied Microscopy. 50 (2020) 1 - p. , 2020

Link: https://doi.org/10.1186/..

5

Making the practically impossible "Merely difficult"—Cryoge..:

Parmenter, Christopher D.J. ; Fay, Michael W. ; Hartfield, Cheryl.
Microscopy Research and Technique. 79 (2016) 4 - p. 298-303 , 2016

Link: https://doi.org/10.1002/..

6

Enhancing Materials and Device Analysis Capability in the S..:

Hiscock, Matthew ; Lang, Christian ; Statham, Peter..
Microscopy and Microanalysis. 22 (2016) S3 - p. 16-17 , 2016

Link: https://doi.org/10.1017/..

7

Cryogenic FIB Lift-out as a Preparation Method for Damage-F..:

Parmenter, Christopher ; Fay, Michael ; Hartfield, Cheryl..
Microscopy and Microanalysis. 20 (2014) S3 - p. 1224-1225 , 2014

Link: https://doi.org/10.1017/..

8

In-Situ Quantification of TEM Lamella Thickness and Ga Impl..:

Hiscock, Matthew ; Dawson, Michael ; Lang, Christian..
Microscopy and Microanalysis. 20 (2014) S3 - p. 342-343 , 2014

Link: https://doi.org/10.1017/..

9

Atomic Layer Deposition and Vapor Deposited SAMS in a Cross..:

Principe, E L ; Hartfield, Cheryl ; Kruger, Rocky...
Microscopy Today. 17 (2009) 2 - p. 18-25 , 2009

Link: https://doi.org/10.1017/..

10

Hardware and Techniques for Cross- Correlative TEM and Atom..:

Gorman, Brian P ; Diercks, David ; Salmon, Norman...
Microscopy Today. 16 (2008) 4 - p. 42-47 , 2008

Link: https://doi.org/10.1017/..

11

Adhesion strength measurement of polymer dielectric interfa..:

Kandula, Soma Sekhar V. ; Hartfield, Cheryl D. ; Geubelle, Philippe H..
Thin Solid Films. 516 (2008) 21 - p. 7627-7635 , 2008

Link: https://doi.org/10.1016/..

12

Cellular location of thymus‐leukemia (TL) antigen as shown ..:

Hartfield, Cheryl ; McDowall, Alasdair ; Loveland, Bruce.
Journal of Electron Microscopy Technique. 18 (1991) 2 - p. 148-156 , 1991

Link: https://doi.org/10.1002/..

13

The LaserFIB: new application opportunities combining a hig..:

Tordoff, Ben ; Hartfield, Cheryl ; Holwell, Andrew J...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC7818346/. , 2020

Link: http://www.ncbi.nlm.nih...

14

Glacial vicariance and secondary contact shape demographic ..:

Johnson, Nathan A ; Henderson, Andrew R ; Jones, Jess W...
Journal of Heredity. , 2023

Link: https://doi.org/10.1093/..

15

Pair-bonding leads to convergence in approach behavior to c..:

Rieger, Nathaniel S. ; Monari, Patrick K. ; Hartfield, Kamryn...
PLOS ONE. 16 (2021) 8 - p. e0255295 , 2021

Link: https://doi.org/10.1371/..