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Hashizume, Masaki
172  Ergebnisse:
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1

Lowering the energy threshold using a plastic scintillator ..:

Morishita, Teruaki ; Fukazawa, Yasushi ; Takahashi, Hiromitsu...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  1061 (2024)  - p. 169097 , 2024
Link: https://doi.org/10.1016/..
 
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2

A DfT Technique for Electrical Interconnect Testing of Circ..:

, In: 2023 IEEE CPMT Symposium Japan (ICSJ),
Ikiri, Yuki ; Yotsuyanagi, Hiroyuki ; Ali, Fara Ashikin Binti.. - p. 113-116 , 2023
Link: https://doi.org/10.1109/..
 
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3

On Test Pattern Generation Method for an Approximate Multip..:

, In: 2023 IEEE International Test Conference in Asia (ITC-Asia),
Tokai, Shogo ; Akamatsu, Daichi ; Yotsuyanagi, Hiroyuki. - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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4

Evaluation of a PUF Embedded in the Delay Testable Boundary..:

, In: 2023 International Technical Conference on Circuits/Systems, Computers, and Communications (ITC-CSCC),
Miki, Hayato ; Ohama, Eisuke ; Yotsuyanagi, Hiroyuki. - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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5

Enhanced Interconnect Test Method for Resistive Open Defect..:

, In: 2022 IEEE 31st Asian Test Symposium (ATS),
Ohmatsu, Masao ; Ohtera, Yuto ; Ikiri, Yuki... - p. 49-53 , 2022
Link: https://doi.org/10.1109/..
 
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6

Detectability of Open Defects at Interconnects between Dies..:

, In: 2022 IEEE CPMT Symposium Japan (ICSJ),
Ohmatsu, Masao ; Sako, Fumiya ; Ikiri, Yuki... - p. 94-95 , 2022
Link: https://doi.org/10.1109/..
 
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7

Fault Securing Techniques for Yield and Reliability Enhance..:

, In: 2022 IEEE 31st Asian Test Symposium (ATS),
Lu, Shyue-Kung ; Liu, Zhi-Jia ; Hashizume, Masaki - p. 13-18 , 2022
Link: https://doi.org/10.1109/..
 
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8

Fault-Aware Dependability Enhancement Techniques for Flash ..:

Lu, Shyue-Kung ; Yu, Shu-Chi ; Hsu, Chun-Lung...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  28 (2020)  3 - p. 634-645 , 2020
Link: https://doi.org/10.1109/..
 
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9

On Delay Elements in Boundary Scan Cells for Delay Testing ..:

, In: 2019 International 3D Systems Integration Conference (3DIC),
Satoh, Toshiaki ; Yotsuyanagi, Hiroyuki ; Hashizume, Masaki - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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10

Electrical Field Test Method of Resistive Open Defects betw..:

, In: 2019 International 3D Systems Integration Conference (3DIC),
Soneda, Hanna ; Hashizume, Masaki ; Yotsuyanagi, Hiroyuki. - p. 1-5 , 2019
Link: https://doi.org/10.1109/..
 
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11

On Delay Measurement Under Delay Variations in Boundary Sca..:

, In: 2019 IEEE International Test Conference in Asia (ITC-Asia),
Kikuchi, Shuya ; Yotsuyanagi, Hiroyuki ; Hashizume, Masaki - p. 169-174 , 2019
Link: https://doi.org/10.1109/..
 
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12

Fault Leveling Techniques for Yield and Reliability Enhance..:

Lu, Shyue-Kung ; Zhong, Shang-Xiu ; Hashizume, Masaki
Journal of Electronic Testing.  34 (2018)  5 - p. 559-570 , 2018
Link: https://doi.org/10.1007/..
 
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13

Address Remapping Techniques for Enhancing Fabrication Yiel..:

Lu, Shyue-Kung ; Jheng, Hao-Cheng ; Lin, Hao-Wei.
Journal of Electronic Testing.  34 (2018)  4 - p. 435-446 , 2018
Link: https://doi.org/10.1007/..
 
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14

A Design for Testability of Open Defects at Interconnects i..:

ASHIKIN, Fara ; HASHIZUME, Masaki ; YOTSUYANAGI, Hiroyuki..
IEICE Transactions on Information and Systems.  E101.D (2018)  8 - p. 2053-2063 , 2018
Link: https://doi.org/10.1587/..
 
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15

Discrimination of a Resistive Open Using Anomaly Detection ..:

YOTSUYANAGI, Hiroyuki ; ISE, Kotaro ; HASHIZUME, Masaki..
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences.  E100.A (2017)  12 - p. 2842-2850 , 2017
Link: https://doi.org/10.1587/..
 
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