Hatano, Toshiaki ;
Zhang, Kaiqiang ;
Khan, Said...
Hatano , T , Zhang , K , Khan , S , Nguyen Tien , T , Herrmann , G , Edwards , C , Burgess , S & Miles , M 2016 , A Specimen-Tracking Controller for the Transverse Dynamic Force Microscope in Non-Contact Mode . in 2016 American Control Conference (ACC 2016) : Proceedings of a meeting held at July 6–8, Boston, MA, USA . , 7526838 , Proceedings of the American Control Conference (ACC) , Institute of Electrical and Electronics Engineers (IEEE) , pp. 7384-7389 , 2016 American Control Conference, ACC 2016 , Boston , United States , 6/07/16 . https://doi.org/10.1109/ACC.2016.7526838.
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2016