Hayashi, Shinichiro
1152  Ergebnisse:
Personensuche X
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1

Reliability under High Gate-Voltage Condition on SiC MOSFET..:

, In: 2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia),
 
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2

Operational Verification of Gate Drive Circuit With Conditi..:

Hayashi, Shin-Ichiro ; Wada, Keiji
IEEE Open Journal of Power Electronics.  5 (2024)  - p. 709-717 , 2024
 
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8

Pulse Burst Multiwavelength Terahertz-Wave Spectroscopic Me..:

Murate, Kosuke ; Kawaguchi, Rie ; Hayashi, Shin'ichiro.
IEEE Transactions on Terahertz Science and Technology.  13 (2023)  5 - p. 561-564 , 2023
 
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10

Pulse train terahertz wave parametric generation:

, In: 2023 48th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz),
 
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11

Frequency Controlled Terahertz wave Parametric Generation b..:

, In: 2023 48th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz),
 
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12

Investigations of Rydberg-Atom Based THz-Wave Electric Fiel..:

, In: 2023 Joint Conference of the European Frequency and Time Forum and IEEE International Frequency Control Symposium (EFTF/IFCS),
 
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13

High-Performance Driving of SiC MOSFETs to Implement Short-..:

, In: 2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023 - ECCE Asia),
Hayashi, Shin-Ichiro ; Wada, Keiji - p. 1485-1490 , 2023
 
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14

Electric field measurement for a 320GHz wave by Rydberg-ato..:

, In: 2023 48th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz),
 
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