E-LIB Suche - Ergebnisse für: He, Chao-Hui

1

Increased severity of complications after therapeutic ERCP ..:

Guo, Ji-Yao ; Zhu, Jia-Hui ; Pan, Jun...
Medicine. 101 (2022) 27 - p. e29753 , 2022

Link: https://doi.org/10.1097/..

2

Single-event-effect propagation investigation on nanoscale ..:

Yang, Wei-Tao ; Du, Xue-Cheng ; Li, Yong-Hong...
Nuclear Science and Techniques. 32 (2021) 10 - p. , 2021

Link: https://doi.org/10.1007/..

3

Impact of layout and profile optimization for inverse-mode ..:

Wei, Jia-Nan ; He, Chao-Hui ; Li, Pei..
Microelectronics Reliability. 105 (2020) - p. 113561 , 2020

Link: https://doi.org/10.1016/..

4

Investigation of single event effect in 28-nm system-on-chi..:

Yang, Wei-Tao ; Li, Yong-Hong ; Guo, Ya-Xin...
Chinese Physics B. 29 (2020) 10 - p. 108504 , 2020

Link: https://doi.org/10.1088/..

5

Impact of displacement damage on single event transient cha..:

Wei, Jia-nan ; He, Chao-hui ; Li, Pei..
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 938 (2019) - p. 29-35 , 2019

Link: https://doi.org/10.1016/..

6

Design of CsI(TI) detector system to search for lost radioa..:

Khan, Waseem ; He, Chao-Hui ; Zhang, Qing-Min..
Nuclear Science and Techniques. 30 (2019) 9 - p. , 2019

Link: https://doi.org/10.1007/..

7

Research on SEE mitigation techniques using back junction a..:

Wei, Jia-Nan ; He, Chao-Hui ; Li, Pei.
Chinese Physics B. 28 (2019) 6 - p. 068503 , 2019

Link: https://doi.org/10.1088/..

8

Simulation of substrate contact effects on heavy ion-induce..:

Wei, Jia-nan ; He, Chao-hui ; Li, Pei..
Microelectronics Reliability. 95 (2019) - p. 28-35 , 2019

Link: https://doi.org/10.1016/..

9

Single-event effects induced by medium-energy protons in 28..:

Yang, Wei-Tao ; Yin, Qian ; Li, Yang...
Nuclear Science and Techniques. 30 (2019) 10 - p. , 2019

Link: https://doi.org/10.1007/..

10

Single event effects in commercial FRAM and mitigation tech..:

Wei, Jia-nan ; Guo, Hong-xia ; Zhang, Feng-qi...
Microelectronics Reliability. 92 (2019) - p. 149-154 , 2019

Link: https://doi.org/10.1016/..

11

Impact of proton-induced alteration of carrier lifetime on ..:

Wei, Jia-Nan ; He, Chao-Hui ; Li, Pei..
Chinese Physics B. 28 (2019) 7 - p. 076106 , 2019

Link: https://doi.org/10.1088/..

12

Analysis of SEE modes in ferroelectric random access memory..:

, In: 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA),

Wei, Jia-Nan ; Guo, Hong-Xia ; Zhang, Feng-Qi.. - p. 1-5 , 2019

Link: https://doi.org/10.1109/..

13

Investigation of enhanced low dose rate sensitivity in SiGe..:

Zhang, Jin-xin ; Guo, Qi ; Guo, Hong-Xia...
Microelectronics Reliability. 84 (2018) - p. 105-111 , 2018

Link: https://doi.org/10.1016/..

14

Evaluation of interfacial properties in SiC composites usin..:

Zang, Hang ; Cao, Xing-Qing ; He, Chao-Hui..
Nuclear Science and Techniques. 29 (2018) 2 - p. , 2018

Link: https://doi.org/10.1007/..

15

An investigation of ionizing radiation damage in different ..:

Li, Pei ; Liu, Mo-Han ; He, Chao-Hui...
Chinese Physics B. 26 (2017) 8 - p. 088503 , 2017

Link: https://doi.org/10.1088/..