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He, Yonggen
65  Ergebnisse:
Personensuche X
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1

Influence of Oxide Interlayer by TiN Metal Gate in High-k F..:

He, Yonggen ; Chen, Yong ; Liu, Hailong...
ECS Journal of Solid State Science and Technology.  6 (2017)  5 - p. P296-P299 , 2017
Link: https://doi.org/10.1149/..
 
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2

Investigation of SiGeB Epitaxy on Different Film Substrates:

Jin, Lan ; Tu, Huojin ; He, Youfeng...
ECS Transactions.  60 (2014)  1 - p. 133-137 , 2014
Link: https://doi.org/10.1149/..
 
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3

Arsenic Dimer (As2+) Lightly Doped Drain (LDD) Implantation..:

Sun, Hao ; Li, Yong ; Zhang, Shuai...
ECS Transactions.  60 (2014)  1 - p. 51-55 , 2014
Link: https://doi.org/10.1149/..
 
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4

Investigation of Poly Film Application in Advanced MOSFET T..:

He, You Feng ; Zhu, Haifeng ; Jin, Lan..
ECS Transactions.  60 (2014)  1 - p. 507-511 , 2014
Link: https://doi.org/10.1149/..
 
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5

Ultrathin Interfacial Layer (UTIL) Formation and Its Applic..:

Yu, Guobin ; He, Yonggen ; Liu, Hailong...
ECS Transactions.  60 (2014)  1 - p. 681-685 , 2014
Link: https://doi.org/10.1149/..
 
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6

Investigation of a Promising Chemical for BEOL Ultra Low K ..:

Hu, Chunzhou ; Yuan, Zhugen ; Liu, Huanxin...
ECS Transactions.  60 (2014)  1 - p. 379-382 , 2014
Link: https://doi.org/10.1149/..
 
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7

A Proprietary Chemical Bath Life Study in MHM ULK Scheme We..:

Yuan, Zhugen ; Liu, HX ; Hu, Chunzhou.
ECS Transactions.  60 (2014)  1 - p. 383-387 , 2014
Link: https://doi.org/10.1149/..
 
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8

A Comprehensive Study of SiGe Source/ Drain Local Stress by..:

Jin, Lan ; Tu, Huojin ; He, Youfeng..
ECS Transactions.  52 (2013)  1 - p. 33-37 , 2013
Link: https://doi.org/10.1149/..
 
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9

Diamond-Shaped e-SiGe Optimization by TCAD Simulation to Im..:

Wu, Hong ; Pan, ZiCheng ; Shi, XueJie...
ECS Transactions.  52 (2013)  1 - p. 61-66 , 2013
Link: https://doi.org/10.1149/..
 
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10

Vacuum Ultraviolet Spectrometric Ellipsometry Application t..:

Chen, Yong ; Wu, Zhenyu ; He, Yonggen...
ECS Transactions.  52 (2013)  1 - p. 897-906 , 2013
Link: https://doi.org/10.1149/..
 
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11

Effect of the Interfacial SiO2 Layer on High-k Gate Stacks:

Chen, Yong ; He, Yonggen ; Liu, Hailong...
ECS Transactions.  52 (2013)  1 - p. 657-663 , 2013
Link: https://doi.org/10.1149/..
 
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12

Investigation of Intermittent Haze in 300mm SiGe Epitaxy Pr..:

He, Yonggen ; He, Youfeng ; Tu, Huojin...
ECS Transactions.  44 (2012)  1 - p. 665-671 , 2012
Link: https://doi.org/10.1149/..
 
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13

A Novel Shallow Trench Isolation Liner Dielectric to Enhanc..:

He, Yonggen ; Yu, Guobing ; Wu, Bing...
ECS Transactions.  44 (2012)  1 - p. 657-663 , 2012
Link: https://doi.org/10.1149/..
 
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14

SiON Gate Dielectric Optimization for NBTI Improvement:

Chen, Yong ; He, Yonggen ; Wang, Wenbo...
ECS Transactions.  34 (2011)  1 - p. 719-724 , 2011
Link: https://doi.org/10.1149/..
 
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15

eSiGe Global and Micro Loading Effect Study in High Perform..:

He, Yonggen ; Tu, Huojin ; Lin, Jing...
ECS Transactions.  34 (2011)  1 - p. 731-736 , 2011
Link: https://doi.org/10.1149/..
 
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