Hedley, E
1031  Ergebnisse:
Personensuche X
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1

Combine 4D STEM and EELS Using a Fast Pixelated Direct Dete..:

Huth, M ; Eckert, B ; Aschauer, S...
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 401-402 , 2023
 
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2

Electron Image Reconstruction for Pixelated Semiconductor T..:

Eckert, B ; Aschauer, S ; Hedley, E...
Microscopy and Microanalysis.  28 (2022)  S1 - p. 3040-3042 , 2022
 
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