E-LIB Suche - Ergebnisse für: Heitmann, Johannes

1

Spectral Characterization of Battery Components from Li-Ion..:

Richter, Julia ; Lorenz, Sandra ; Kaas, Alexandra...
Metals. 14 (2024) 2 - p. 147 , 2024

Link: https://doi.org/10.3390/..

2

Multi-sensor characterization for an improved identificatio..:

de Lima Ribeiro, Andréa ; Fuchs, Margret C. ; Lorenz, Sandra...
Waste Management. 178 (2024) - p. 239-256 , 2024

Link: https://doi.org/10.1016/..

3

Influence of ALD pulse times and deposition temperature on ..:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),

Falidas, Konstantinos Efstathios ; Kuhnel, Kati ; Everding, Maximilian.. - p. 1-3 , 2024

Link: https://doi.org/10.1109/..

4

Influence of Aluminum Co-Doping on Current-Induced Degradat..:

, In: 2023 IEEE 50th Photovoltaic Specialists Conference (PVSC),

Weber, August ; Mohammadi, Mahsa ; Trempa, Matthias... - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

5

Aqueous Polyelectrolyte Electrodeposition: The Effects of A..:

Gersdorf, Sophie ; Schildknecht, Vincent ; Schumann, Erik...
ChemElectroChem. 10 (2023) 17 - p. , 2023

Link: https://doi.org/10.1002/..

6

Stabilizing Antiferroelectric‐Like Aluminum‐Doped Hafnium O..:

Viegas, Alison Erlene ; Kuehnel, Kati ; Mart, Clemens..
Advanced Engineering Materials. 25 (2023) 20 - p. , 2023

Link: https://doi.org/10.1002/..

7

Impact of High-K Deposition Process on the Noise Immunity o..:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),

Raffel, Yannick ; Olivo, Ricardo ; Lederer, Maximilian... - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

8

Luminescence Spectroscopy of Mechanically Processed Lithium..:

, In: 2023 IEEE SENSORS,

Tschagaew, Roman ; Roder, Christian ; Kaas, Alexandra. - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

9

Ultra-low resistance Au-free V/Al/Ti/TiN ohmic contacts for..:

Garbe, Valentin ; Seidel, Sarah ; Schmid, Alexander...
Applied Physics Letters. 123 (2023) 20 - p. , 2023

Link: https://doi.org/10.1063/..

10

Analyzing the Conduction Mechanism and TDDB Reliability of ..:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),

Viegas, Alison E. ; Everding, Maximilian ; Falidas, Konstantinos E.... - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

11

Automated reliability calculation of failure rate, lifetime..:

Falidas, Konstantinos Efstathios ; Everding, Maximilian B. ; Viegas, Alison E...
Microelectronics Reliability. 150 (2023) - p. 115191 , 2023

Link: https://doi.org/10.1016/..

12

Importance of the Buffer Layer Properties for the Performan..:

Kern, Jonas ; Heitmann, Johannes ; Müller, Matthias
ACS Applied Energy Materials. 6 (2023) 4 - p. 2199-2206 , 2023

Link: https://doi.org/10.1021/..

13

ZrAlxOy high-k dielectrics for MIM decoupling capacitors in..:

, In: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT),

Falidas, Konstantinos ; Mertens, Konstantin ; Everding, Maximilian.. - p. 1-2 , 2023

Link: https://doi.org/10.1109/..

14

Three-Dimensional Metal-Insulator-Metal Decoupling Capacito..:

Falidas, Konstantinos Efstathios ; Kühnel, Kati ; Rudolph, Matthias...
Materials. 15 (2022) 23 - p. 8325 , 2022

Link: https://doi.org/10.3390/..

15

Characterization of Ultrathin FDSOI Stacks Using Low‐Field ..:

Mchedlidze, Teimuraz ; Schmid, Alexander ; Heitmann, Johannes
physica status solidi (a). 219 (2022) 17 - p. , 2022

Link: https://doi.org/10.1002/..