Ich stimme zu, dass diese Seite Cookies verwende. Weitere Informationen finden Sie unter unseren Datenschutzerklärungen .
X
Helou, Assaad El
16  Ergebnisse:
Personensuche X
?
1

Thermal Conductivity of Amorphous NbOx Thin Films and Its E..:

Nandi, Sanjoy Kumar ; Das, Sujan Kumar ; Cui, Yubo...
ACS Applied Materials & Interfaces.  14 (2022)  18 - p. 21270-21277 , 2022
Link: https://doi.org/10.1021/..
 
?
2

PCB Layout for Chip-Scale Package GaN Fets Optimizes Both E..:

, In: 2022 IEEE Applied Power Electronics Conference and Exposition (APEC),
Glaser, John S. ; Helou, Assaad - p. 991-998 , 2022
Link: https://doi.org/10.1109/..
 
?
3

High Resolution Thermoreflectance Imaging and Numerical Mod..:

, In: 2020 19th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm),
El Helou, Assaad ; Cui, Yubo ; Tadjer, Marko.. - p. 192-195 , 2020
Link: https://doi.org/10.1109/..
 
?
4

Assessment of CMP Fill Pattern Effect on the Thermal Perfor..:

, In: 2019 IEEE 69th Electronic Components and Technology Conference (ECTC),
El Helou, Assaad ; Venugopal, Archana ; Raad, Peter E. - p. 405-409 , 2019
Link: https://doi.org/10.1109/..
 
?
5

(Invited) Coupled Experimental and Numerical Investigation ..:

Cui, Yubo ; El Helou, Assaad ; Raad, Peter E.
ECS Transactions.  89 (2019)  5 - p. 11-16 , 2019
Link: https://doi.org/10.1149/..
 
?
6

Characterization of Temperature Rise in Alternating Current..:

Koklu, Anil ; El Helou, Assaad ; Raad, Peter E..
Analytical Chemistry.  91 (2019)  19 - p. 12492-12500 , 2019
Link: https://doi.org/10.1021/..
 
?
7

Full 3D Thermal Simulation of GaN HEMT using Ultra-Fast Sel..:

, In: 2018 24rd International Workshop on Thermal Investigations of ICs and Systems (THERMINIC),
Helou, Assaad El ; Tadjer, Marko J. ; Hobart, Karl D.. - p. 1-3 , 2018
Link: https://doi.org/10.1109/..
 
?
8

Temperature dependence of the thermoreflectance coefficient..:

, In: 2018 34th Thermal Measurement, Modeling & Management Symposium (SEMI-THERM),
El Helou, Assaad ; Raad, Peter E. ; Komarov, Pavel - p. 161-164 , 2018
Link: https://doi.org/10.1109/..
 
?
9

Advanced Thermal Characterization and Temperature Control t..:

El Helou, Assaad
https://scholar.smu.edu/engineering_mechanical_etds/31.  , 2020
Link: https://scholar.smu.edu/..
 
?
10

Current localisation and redistribution as the basis of dis..:

Nandi, Sanjoy Kumar ; Nath, Shimul Kanti ; Helou, Assaad El...
http://arxiv.org/abs/1906.08980.  , 2019
Link: http://arxiv.org/abs/190..
 
?
11

Electric field and current induced electroforming modes in ..:

Nandi, Sanjoy Kumar ; Nath, Shimul Kanti ; Helou, Assaad El...
http://arxiv.org/abs/1909.06443.  , 2019
Link: http://arxiv.org/abs/190..
 
?
12

Current localisation and redistribution as the basis of dis..:

Nandi, Sanjoy ; Nath, Shimul Kanti ; El Helou, Assaad...
http://purl.org/au-research/grants/arc/LP150100693.  ,
Link: http://hdl.handle.net/18..
 
?
13

Schottky-Barrier-Induced Asymmetry in the Negative-Differen..:

Nath, Shimul Kanti ; Nandi, Sanjoy Kumar ; El-Helou, Assaad...
Physical Review Applied.  13 (2020)  6 - p. , 2020
Link: https://doi.org/10.1103/..
 
?
14

Electric Field- and Current-Induced Electroforming Modes in..:

Nandi, Sanjoy Kumar ; Nath, Shimul Kanti ; El-Helou, Assaad E....
ACS Applied Materials & Interfaces.  12 (2020)  7 - p. 8422-8428 , 2020
Link: https://doi.org/10.1021/..
 
?
15

Schottky barrier induced asymmetry in the negative differen..:

Nath, Shimul Kanti ; Nandi, Sanjoy Kumar ; El-Helou, Assaad...
http://arxiv.org/abs/1912.08371.  , 2019
Link: http://arxiv.org/abs/191..
 
1-15