Hensel, C
8076  Ergebnisse:
Personensuche X
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2

Erratum: Dose rate effects in the radiation damage of the p..:

Khachatryan, V ; Sirunyan, A.M ; Tumasyan, A...
Journal of Instrumentation.  14 (2019)  8 - p. E08001-E08001 , 2019
 
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3

Erratum: Dose rate effects in the radiation damage of the p..:

Khachatryan, V ; Sirunyan, A.M ; Tumasyan, A...
Journal of Instrumentation.  14 (2019)  8 - p. E08001-E08001 , 2019
 
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4

Brightness and uniformity measurements of plastic scintilla..:

Chatrchyan, S. ; Sirunyan, A.M. ; Tumasyan, A....
Journal of Instrumentation.  13 (2018)  1 - p. P01002-P01002 , 2018
 
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6

Radioactive source calibration test of the CMS Hadron Endca..:

Chatrchyan, S. ; Sirunyan, A.M. ; Tumasyan, A....
Journal of Instrumentation.  12 (2017)  12 - p. P12034-P12034 , 2017
 
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9

Dose rate effects in the radiation damage of the plastic sc..:

Khachatryan, V. ; Sirunyan, A.M. ; Tumasyan, A....
Journal of Instrumentation.  11 (2016)  10 - p. T10004-T10004 , 2016
 
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10

Spinal cord injury: association with axonal peripheral neur..:

Kamradt, T. ; Rasch, C. ; Schuld, C....
European Journal of Neurology.  20 (2013)  5 - p. 843-848 , 2013
 
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11

Preventing the explosion of acetylene cylinders involved in..:

Ferrero, F. ; Beckmann-Kluge, M. ; Kreißig, M....
Journal of Loss Prevention in the Process Industries.  25 (2012)  2 - p. 364-372 , 2012
 
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12

Analysis of light-yield spectra observed with multi-anode P..:

Hoepfner, K. ; Skiba, A. ; Hensel, C.
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  483 (2002)  3 - p. 747-757 , 2002
 
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13

Efficient detection of single photons – a comparative study..:

Hoepfner, K. ; Skiba, A. ; Hensel, C.
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  461 (2001)  1-3 - p. 568-570 , 2001
 
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14

Evidence from spectral emissometry for conduction intraband..:

Abedrabbo, S. ; Hensel, J. C. ; Fiory, A. T..
Journal of Electronic Materials.  28 (1999)  12 - p. 1390-1393 , 1999
 
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15

Perspectives on emissivity measurements and modeling in sil..:

Abedrabbo, S. ; Hensel, J.C. ; Fiory, A.T....
Materials Science in Semiconductor Processing.  1 (1998)  3-4 - p. 187-193 , 1998
 
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