Herrera, Luis A
13507  Ergebnisse:
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A Probabilistic Approach to Series Arc Fault Detection and ..:

Gajula, Kaushik ; Le, Vu ; Yao, Xiu..
IEEE Journal of Emerging and Selected Topics in Industrial Electronics.  5 (2024)  1 - p. 27-38 , 2024
 
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10

Adaptive Method for Li-Ion Cell State-of-Charge Estimation ..:

, In: NAECON 2023 - IEEE National Aerospace and Electronics Conference,
 
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11

TechLean: Value-added model for process optimization and au..:

, In: 2023 IEEE Colombian Caribbean Conference (C3),
 
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12

KitBit: A New AI Model for Solving Intelligence Tests and N..:

Corsino, Víctor ; Gilpérez, José Manuel ; Herrera, Luis
IEEE Transactions on Pattern Analysis and Machine Intelligence.  45 (2023)  11 - p. 13893-13903 , 2023
 
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15

Model Based Change Detection Approach For Sensor Fault Iden..:

, In: NAECON 2023 - IEEE National Aerospace and Electronics Conference,
 
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