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Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design ,
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Session details: Improving planarity and patterning:
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Proceedings of the 7th International Symposium on Quality Electronic Design ,
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Yield Improvement by Local Wiring Redundancy:
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Proceedings of the 2005 international symposium on Physical design ,
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Technology migration technique for designs with strong RET-..:
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