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Hinkle, C. L.
843  Ergebnisse:
Personensuche X
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1

Bandgap engineering of two-dimensional semiconductor materi..:

Chaves, A. ; Azadani, J. G. ; Alsalman, Hussain...
npj 2D Materials and Applications.  4 (2020)  1 - p. , 2020
Link: https://doi.org/10.1038/..
 
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2

(289) Unexpected relationship between optimism and pain red..:

Hinkle, C. ; Boyd, E. ; Quiton, R.
The Journal of Pain.  18 (2017)  4 - p. S48 , 2017
Link: https://doi.org/10.1016/..
 
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3

(219) Regional brain structure differences in learning, mot..:

Kim, P. ; Hinkle, C. ; Zhang, R....
The Journal of Pain.  17 (2016)  4 - p. S30 , 2016
Link: https://doi.org/10.1016/..
 
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4

Transition metal dichalcogenide and hexagonal boron nitride..:

Barton, A.T. ; Yue, R. ; Anwar, S....
Microelectronic Engineering.  147 (2015)  - p. 306-309 , 2015
Link: https://doi.org/10.1016/..
 
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5

Electrical characterization of top-gated molybdenum disulfi..:

Zhao, P. ; Vyas, P.B. ; McDonnell, S....
Microelectronic Engineering.  147 (2015)  - p. 151-154 , 2015
Link: https://doi.org/10.1016/..
 
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6

Accumulation capacitance frequency dispersion of III-V meta..:

Galatage, R. V. ; Zhernokletov, D. M. ; Dong, H....
Journal of Applied Physics.  116 (2014)  1 - p. , 2014
Link: https://doi.org/10.1063/..
 
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7

Formation of pre-silicide layers below Ni1−xPtxSi/Si interf..:

Thron, A.M. ; Pennycook, T.J. ; Chan, J....
Acta Materialia.  61 (2013)  7 - p. 2481-2488 , 2013
Link: https://doi.org/10.1016/..
 
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8

In situ study of the role of substrate temperature during a..:

Dong, H. ; K.C., Santosh, ; Qin, X....
Journal of Applied Physics.  114 (2013)  15 - p. , 2013
Link: https://doi.org/10.1063/..
 
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9

Chemical and electrical characterization of the HfO2/InAlAs..:

Brennan, B. ; Galatage, R. V. ; Thomas, K....
Journal of Applied Physics.  114 (2013)  10 - p. , 2013
Link: https://doi.org/10.1063/..
 
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10

In situ study of HfO2 atomic layer deposition on InP(100):

Dong, H. ; Brennan, B. ; Zhernokletov, D....
Applied Physics Letters.  102 (2013)  17 - p. , 2013
Link: https://doi.org/10.1063/..
 
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11

Indium diffusion through high-k dielectrics in high-k/InP s..:

Dong, H. ; Cabrera, W. ; Galatage, R. V....
Applied Physics Letters.  103 (2013)  6 - p. , 2013
Link: https://doi.org/10.1063/..
 
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12

PtSi dominated Schottky barrier heights of Ni(Pt)Si contact..:

Chan, J. ; Balakchiev, M. ; Thron, A. M....
Applied Physics Letters.  102 (2013)  12 - p. , 2013
Link: https://doi.org/10.1063/..
 
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13

Electrical and chemical characteristics of Al2O3/InP metal-..:

Galatage, R. V. ; Dong, H. ; Zhernokletov, D. M....
Applied Physics Letters.  102 (2013)  13 - p. , 2013
Link: https://doi.org/10.1063/..
 
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14

In situstudy of atomic layer deposition Al2O3on GaP (100):

Dong, H. ; Brennan, B. ; Qin, X....
Applied Physics Letters.  103 (2013)  12 - p. 121604 , 2013
Link: https://doi.org/10.1063/..
 
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15

Substitutional and Interstitial Diffusion of Ni across the ..:

Thron, A. ; van Benthem, K. ; Chan, J....
Microscopy and Microanalysis.  18 (2012)  S2 - p. 344-345 , 2012
Link: https://doi.org/10.1017/..
 
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