Pooth, Alexander ;
Bergsten, J ;
Rorsman, N...
Pooth , A , Bergsten , J , Rorsman , N , Hirshy , H , Perks , R , Tasker , P , Martin , T , Webster , R F , Cherns , D , Uren , M J & Kuball , M 2017 , ' Morphological and electrical comparison of Ti and Ta based ohmic contacts for AlGaN/GaN-on-SiC HFETs ' , Microelectronics Reliability , vol. 68 , pp. 2-4 . https://doi.org/10.1016/j.microrel.2016.11.002.
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2017