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2023 Silicon Nanoelectronics Workshop (SNW) ,
2
Record-High Memory Window and Robust Retention Anti-Fuse OT..:
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2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
6
Investigation on Polarization and Trapping Dominated Reliab..:
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2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
9
Investigation of Ge channel Complemental Field Effect Trans..:
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KAIST Research Series; A New Perspective of Cultural DNA ,
10
Shape Machine: A Primer for Visual Computation:
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Design Computing and Cognition'22 ,
12