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Hou, Vincent D H
3920  Ergebnisse:
Personensuche X
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1

Visualizing Defects and Amorphous Materials in 3D with Mixe..:

Karapetyan, Shake ; Zeltmann, Steven ; Chen, Ta-Kun..
Microscopy and Microanalysis.  30 (2024)  Supplement_1 - p. , 2024
Link: https://doi.org/10.1093/..
 
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2

Small Molecule Additives to Suppress Bundling in Dimensiona..:

Chao, Tzu‐Ang ; Chuu, Chih‐Piao ; Liew, San‐Lin...
Advanced Materials Interfaces.  11 (2023)  6 - p. , 2023
Link: https://doi.org/10.1002/..
 
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3

High-performance and low parasitic capacitance CNT MOSFET: ..:

, In: 2023 International Electron Devices Meeting (IEDM),
Li, Shengman ; Chao, Tzu-Ang ; Gilardi, Carlo... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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4

3D Sectioning of Rough Interfaces Using Mixed-State Multisl..:

Karapetyan, Shake ; Chen, Ta-Kun ; Hou, Vincent D H.
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 288-290 , 2023
Link: https://doi.org/10.1093/..
 
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5

Monolayer-MoS2 Stacked Nanosheet Channel with C-type Metal ..:

, In: 2023 International Electron Devices Meeting (IEDM),
Chung, Yun-Yan ; Yun, Wei-Sheng ; Chou, Bo-Jhih... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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6

Building high performance transistors on carbon nanotube ch..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Pitner, Gregory ; Safron, Nathaniel ; Chao, Tzu-Ang... - p. 1-2 , 2023
Link: https://doi.org/10.23919..
 
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7

Observation of anti-damping spin–orbit torques generated by..:

DC, Mahendra ; Shao, Ding-Fu ; Hou, Vincent D.-H....
Nature Materials.  22 (2023)  5 - p. 591-598 , 2023
Link: https://doi.org/10.1038/..
 
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8

Low N-Type Contact Resistance to Carbon Nanotubes in Highly..:

, In: 2023 International Electron Devices Meeting (IEDM),
Safron, Nathaniel ; Chiu, Hsin-Yuan ; Chao, Tzu-Ang... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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9

Complementary carbon nanotube metal–oxide–semiconductor fie..:

Zhang, Zichen ; Passlack, Matthias ; Pitner, Gregory...
Nature Electronics.  6 (2023)  12 - p. 999-1008 , 2023
Link: https://doi.org/10.1038/..
 
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10

Direct Quantitative Extraction of Internal Variables from M..:

, In: 2022 International Electron Devices Meeting (IEDM),
Passlack, Matthias ; Tasneem, Nujhat ; Wang, Zheng... - p. 32.4.1-32.4.4 , 2022
Link: https://doi.org/10.1109/..
 
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11

Measurement of Ferroelectric Properties of Nanometer Scaled..:

Huang, Fei ; Passlack, Matthias ; Liew, San Lin...
IEEE Electron Device Letters.  43 (2022)  2 - p. 212-215 , 2022
Link: https://doi.org/10.1109/..
 
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12

Automatic Page-Layout Scripts for Gatan Digital Micrograph®:

Hou, Vincent D.-H.
Microscopy and Microanalysis.  7 (2001)  S2 - p. 976-977 , 2001
Link: https://doi.org/10.1017/..
 
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13

Large and Robust Charge-to-Spin Conversion in Sputtered Con..:

Li, Xiang ; Li, Peng ; Hou, Vincent D. -H...
http://arxiv.org/abs/2001.04054.  , 2020
Link: http://arxiv.org/abs/200..
 
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14

Observation of anti-damping spin-orbit torques generated by..:

DC, Mahendra ; Shao, Ding-Fu ; Hou, Vincent D. -H...
http://arxiv.org/abs/2012.09315.  , 2020
Link: http://arxiv.org/abs/201..
 
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15

Scaled contact length with low contact resistance in monola..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Wu, Wen-Chia ; Hung, Terry Y.T. ; Sathaiya, D. Mahaveer... - p. 1-2 , 2023
Link: https://doi.org/10.23919..
 
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