Personensuche
X
?
2020 IEEE Symposium on VLSI Technology ,
4
Ultrahigh responsivity and tunable photogain BEOL compatibl..:
, In:
?
2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits ,
11
Fast and reliable charge-trap non-volatile memories using l..:
, In:
?
2014 IEEE International Electron Devices Meeting ,
14