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Hu, Jennifer Shueh-Inn
6  Ergebnisse:
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1

Test Compression for Neuromorphic Chips:

, In: 2024 IEEE European Test Symposium (ETS),
Chen, Xin-Ping ; Huang, Hsu-Yu ; Hsiao, Chu-Yun.. - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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2

Automatic Test Configuration and Pattern Generation (ATCPG)..:

, In: Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design,
Chiu, I-Wei ; Chen, Xin-Ping ; Hu, Jennifer Shueh-Inn. - p. 1-7 , 2022
Link: https://dl.acm.org/doi/1..
 
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3

Design and Implementation of a Hand-held Lensless Light Fie..:

, In: 2020 IEEE International Conference on Consumer Electronics - Asia (ICCE-Asia),
Ho, Chun-Hsien ; Lin, Yi-Hsien ; Hu, Jennifer Shueh-Inn. - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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4

Compressing DNN Parameters for Model Loading Time Reduction:

, In: 2019 IEEE International Conference on Consumer Electronics - Asia (ICCE-Asia),
Yeh, Yang-Ming ; Hu, Jennifer Shueh-Inn ; Lin, Yen-Yu. - p. 78-79 , 2019
Link: https://doi.org/10.1109/..
 
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5

Krein-Milman's Extreme Point Theorem and Weak Topology on H..:

Hu, Jennifer Shueh-Inn ; Hu, Thakyin
Taiwanese Journal of Mathematics.  20 (2016)  3 - p. 629-638 , 2016
Link: https://www.jstor.org/st..
 
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6

Markov-Kakutani Theorem on Hyperspace of a Banach Space:

Hu, Shueh-Inn ; Hu, Thakyin
Tamkang Journal of Mathematics.  52 (2021)  1 - p. 19-23 , 2021
Link: https://doi.org/10.5556/..
 
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