Huang, Ting-Chang
38593  Ergebnisse:
Personensuche X
?
1

SpotLight: A Hotspot-Greedy, Light-Weighted, and Automated ..:

, In: 2024 25th International Symposium on Quality Electronic Design (ISQED),
Wu, Chin-Wei ; Lee, Yu-Min ; Huang, Pei-Yu... - p. 1-8 , 2024
 
?
2

TridentFS: a hybrid file system for non-volatile RAM, flash..:

Huang, Ting-Chang ; Chang, Da-Wei
Software: Practice and Experience.  46 (2014)  3 - p. 291-318 , 2014
 
?
4

Performance of RoutineHelicobacter pyloriInvasive Tests in ..:

Lee, Hsi-Chang ; Huang, Ting-Chang ; Lin, Chin-Lin...
Gastroenterology Research and Practice.  2013 (2013)  - p. 1-5 , 2013
 
?
6

The Characteristics and Reliability With Channel Length Dep..:

Kuo, Chuan-Wei ; Tsai, Tsung-Ming ; Chang, Ting-Chang...
IEEE Transactions on Device and Materials Reliability.  24 (2024)  2 - p. 268-274 , 2024
 
?
7

Analysis of Abnormal C–V Hump on Si3N4 MIS-HEMT With Mesa I..:

Lee, Ya-Huan ; Chang, Kai-Chun ; Lin, Hsin-Ni...
IEEE Transactions on Electron Devices.  71 (2024)  4 - p. 2349-2354 , 2024
 
?
 
?
9

The Transition of Threshold Voltage Shift of Al2O3/Si3N4 Al..:

Lee, Ya-Huan ; Chang, Kai-Chun ; Tai, Mao-Chou...
IEEE Transactions on Electron Devices.  71 (2024)  3 - p. 1792-1797 , 2024
 
?
12

Investigation of Threshold Voltage and Drain Current Degrad..:

Kuo, Hung-Ming ; Chang, Ting-Chang ; Chang, Kai-Chun...
IEEE Transactions on Electron Devices.  70 (2023)  5 - p. 2216-2221 , 2023
 
?
13

Analysis of Critical Schottky Distance Effect and Distribut..:

, In: 2023 35th International Conference on Microelectronic Test Structure (ICMTS),
 
?
14

Performance Improvement by Enhancing Passivation Layer of p..:

Chou, Sheng-Yao ; Wu, Pei-Yu ; Chen, Ming-Chen...
IEEE Electron Device Letters.  44 (2023)  2 - p. 213-216 , 2023
 
1-15