Hubbard, William
1143  Ergebnisse:
Personensuche X
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1

Chasing Down Leads: Imaging Conductivity Networks in a FinF..:

Hubbard, William A ; Bonifacio, C S ; Li, R...
Microscopy and Microanalysis.  30 (2024)  Supplement_1 - p. , 2024
 
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2

Understanding Ferroelectric Polarization in Hafnium Zirconi..:

Regan, B C ; Chen, Yueyun ; O'Neill, Tristan...
Microscopy and Microanalysis.  30 (2024)  Supplement_1 - p. , 2024
 
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3

PFIB and STEM EBIC: A Potent Combination for Operando TEM o..:

Hubbard, William A ; Regan, B C
Microscopy and Microanalysis.  30 (2024)  Supplement_1 - p. , 2024
 
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5

Nano-PUND and STEM EBIC Imaging for Ferroelectric Polarizat..:

Chan, Ho Leung ; Chen, Yueyun ; O'Neill, Tristan...
Microscopy and Microanalysis.  30 (2024)  Supplement_1 - p. , 2024
 
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6

TEM Imaging of Bias-Induced Electronic Changes in a GaN HEM:

Hubbard, William A ; Regan, B C
Microscopy and Microanalysis.  30 (2024)  Supplement_1 - p. , 2024
 
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9

Emission-Based Temperature Mapping with STEM EBIC:

Hubbard, William A ; Mecklenburg, Matthew ; Chan, Ho Leung.
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 1608-1609 , 2023
 
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11

Mapping Conductivity in the TEM with SEEBIC:

Hubbard, William A ; Chan, Ho Leung ; Regan, B C
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 1851-1852 , 2023
 
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14

InAsP Quantum Dot-Embedded InP Nanowires toward Silicon Pho..:

Chang, Ting-Yuan ; Kim, Hyunseok ; Hubbard, William A....
ACS Applied Materials & Interfaces.  14 (2022)  10 - p. 12488-12494 , 2022
 
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