Hwang, Chi-Sun
9506  Ergebnisse:
Personensuche X
?
1

Device Feasibility of 60-nm-Scaled Vertical-Channel Memory ..:

Cho, Yun-Ju ; Kwon, Young-Ha ; Seong, Nak-Jin...
IEEE Transactions on Electron Devices.  71 (2024)  3 - p. 1839-1844 , 2024
 
?
2

Comparative analysis on negative-bias-illumination-stress i..:

Kang, Ji-Won ; Lee, Dong-Hee ; Kwon, Young-Ha...
Materials Science in Semiconductor Processing.  181 (2024)  - p. 108665 , 2024
 
?
3

Impact of channel thickness on device scaling in vertical I..:

Cho, Yun-Ju ; Kwon, Young-Ha ; Seong, Nak-Jin...
Materials Science in Semiconductor Processing.  178 (2024)  - p. 108476 , 2024
 
?
 
?
10

Contact properties of a low-resistance aluminum-based elect..:

Jeon, Sori ; Lee, Kwang-Heum ; Lee, Seung-Hee...
Journal of Materials Chemistry C.  11 (2023)  41 - p. 14177-14186 , 2023
 
?
13

Highly stable Mo/Al bilayer electrode for stretchable elect..:

Choi, Ji Hun ; Park, Chan Woo ; Na, Bock Soon...
Journal of Information Display.  24 (2023)  2 - p. 137-145 , 2023
 
?
14

Geometrical and Structural Design Schemes for Trench-Shaped..:

Ahn, Hyun-Min ; Moon, Seo-Hyun ; Kwon, Young-Ha...
IEEE Electron Device Letters.  43 (2022)  11 - p. 1909-1912 , 2022
 
?
15

Improvement in Short-Channel Effects of the Thin-Film Trans..:

Noh, Shin-Ho ; Kim, Hyo-Eun ; Yang, Jong-Heon...
IEEE Transactions on Electron Devices.  69 (2022)  10 - p. 5542-5548 , 2022
 
1-15